Published August 22, 2007 | Version v1
Journal article Metadata-only

Two-dimensional pattern reverse Monte Carlo method for modelling the structures of nano-particles in uniaxial elongated rubbers

Creators

  • 1. Department of Applied Physics, National Defense Academy, Yokosuka 239-8686 (Japan)
  • 2. SRI Research and Development Ltd, Kobe 651-0071 (Japan)
  • 3. Japan Synchrotron Radiation Research Institute (JASRI), Hyogo 651-5198, Japan (Japan)
  • 4. Department of Advanced Materials Science, University of Tokyo, Kashiwa 277-8561 (Japan)

Description

Two-dimensional pattern reverse Monte Carlo (2D pattern RMC) analysis is performed to model the structures of nano-particles in uniaxially elongated rubbers using two-dimensional patterns of structure factor of the nano-particles obtained by time-resolved two-dimensional ultra-small angle x-ray scattering. Four spot patterns are observed for a large elongation ratio and the shapes change with increasing elongation ratio. We performed the 2D pattern RMC method for the uniaxial system in order to make a model of the structures from the two-dimensional structure factors. The preliminary results of the 2D pattern RMC analysis of the two-dimensional structure factors of silica particles in a uniaxially elongated styrene-butadiene rubber are presented

Additional details

Identifiers

DOI
10.1088/0953-8984/19/33/335217;
PII
S0953-8984(07)43898-X;

Publishing Information

Journal Title
Journal of Physics. Condensed Matter
Journal Volume
19
Journal Issue
33
Journal Page Range
p. 335217
ISSN
0953-8984
CODEN
JCOMEL

Conference

Title
The first eighteen years of reverse Monte Carlo modelling
Acronym
3. workshop on reverse Monte Carlo (RMC)
Dates
28-30 Sep 2006
Place
Budapest (Hungary)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39047710
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BUTADIENE; ELONGATION; MONTE CARLO METHOD; PARTICLES; RUBBERS; SILICA; SIMULATION; SMALL ANGLE SCATTERING; STRUCTURE FACTORS; STYRENE; TIME RESOLUTION; TWO-DIMENSIONAL CALCULATIONS; X-RAY DIFFRACTION
Descriptors DEC
ALKYLATED AROMATICS; AROMATICS; CALCULATION METHODS; COHERENT SCATTERING; DEFORMATION; DIENES; DIFFRACTION; DIMENSIONLESS NUMBERS; ELASTOMERS; HYDROCARBONS; MINERALS; ORGANIC COMPOUNDS; ORGANIC POLYMERS; OXIDE MINERALS; POLYENES; POLYMERS; RESOLUTION; SCATTERING; TIMING PROPERTIES