Published December 1979
| Version v1
Journal article
Modeling and test verificaton for hardened integrated circuits
Creators
- 1. Rockwell International, Anaheim, CA
Description
Hardened dielectrically isolated integrated circuits are being developed to provide an order of magnitude improvement in radiation response over previous bipolar technology. This study describes (a) the analytical and experimental techniques used to develop the hardened parts, and (b) comparative analytical and test results obtained thus far in the program. This study describes how (a) various element models were defined for CAD usage, (b) how design tolerances were established for the element models, (c) how circuit design margins were established, (d) experimental techniques and equipment used to validate early designs, and (e) comparative analytical and test results
Additional details
Publishing Information
- Journal Title
- IEEE Trans. Nucl. Sci.
- Journal Volume
- NS-26
- Journal Issue
- 6
- Series
- IEEE Trans. Nucl. Sci.
- Journal Page Range
- 4763-4768
- ISSN
- 0018-9499
Conference
- Title
- 1979 IEEE Annual conference on nuclear and space radiation effects.
- Dates
- 17 - 20 Jul 1979.
- Place
- Santa Cruz, CA, USA.
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 12608563
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- INTEGRATED CIRCUITS; RADIATION HARDENING
- Descriptors DEC
- ELECTRONIC CIRCUITS; HARDENING; PHYSICAL RADIATION EFFECTS; RADIATION EFFECTS
Optional Information
- Secondary number(s)
- CONF-790706--.