Published December 1979 | Version v1
Journal article

Modeling and test verificaton for hardened integrated circuits

  • 1. Rockwell International, Anaheim, CA

Description

Hardened dielectrically isolated integrated circuits are being developed to provide an order of magnitude improvement in radiation response over previous bipolar technology. This study describes (a) the analytical and experimental techniques used to develop the hardened parts, and (b) comparative analytical and test results obtained thus far in the program. This study describes how (a) various element models were defined for CAD usage, (b) how design tolerances were established for the element models, (c) how circuit design margins were established, (d) experimental techniques and equipment used to validate early designs, and (e) comparative analytical and test results

Additional details

Publishing Information

Journal Title
IEEE Trans. Nucl. Sci.
Journal Volume
NS-26
Journal Issue
6
Series
IEEE Trans. Nucl. Sci.
Journal Page Range
4763-4768
ISSN
0018-9499

Conference

Title
1979 IEEE Annual conference on nuclear and space radiation effects.
Dates
17 - 20 Jul 1979.
Place
Santa Cruz, CA, USA.

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
12608563
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
INTEGRATED CIRCUITS; RADIATION HARDENING
Descriptors DEC
ELECTRONIC CIRCUITS; HARDENING; PHYSICAL RADIATION EFFECTS; RADIATION EFFECTS

Optional Information

Secondary number(s)
CONF-790706--.