Published March 2, 2015 | Version v1
Journal article

Low-temperature spray-deposited indium oxide for flexible thin-film transistors and integrated circuits

  • 1. Blackett Laboratory, Department of Physics and Centre for Plastic Electronics, Imperial College London, London SW7 2BW (United Kingdom)
  • 2. Electronics Laboratory, Swiss Federal Institute of Technology Zurich, Gloriastrasse 35, 8092 Zurich (Switzerland)
  • 3. Department of Physics, Laboratory of Applied Physics, Aristotle University of Thessaloniki, GR-54124 Thessaloniki (Greece)

Description

Indium oxide (In2O3) films were deposited by ultrasonic spray pyrolysis in ambient air and incorporated into bottom-gate coplanar and staggered thin-film transistors. As-fabricated devices exhibited electron-transporting characteristics with mobility values of 1 cm2V−1s−1 and 16 cm2V−1s−1 for coplanar and staggered architectures, respectively. Integration of In2O3 transistors enabled realization of unipolar inverters with high gain (5.3 V/V) and low-voltage operation. The low temperature deposition (≤250 °C) of In2O3 also allowed transistor fabrication on free-standing 50 μm-thick polyimide foils. The resulting flexible In2O3 transistors exhibit good characteristics and remain fully functional even when bent to tensile radii of 4 mm

Additional details

Identifiers

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
106
Journal Issue
9
Journal Page Range
p. 092105-092105.4
ISSN
0003-6951
CODEN
APPLAB

Optional Information

Notes
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