Published September 19, 2011 | Version v1
Journal article Metadata-only

Aberration effects in quick X-Ray reflectivity of curved samples

Creators

  • 1. AECL - Chalk River Laboratories, Chalk River, Ontario K0J 1J0 (Canada)
  • 2. National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, Ibaraki (Japan)

Description

Quick x-ray reflectivity (QXRR) is a new surface examination technique for studying fast processes at the surface and interface of the materials on a nano-scale. The currently available models for classical scanning-type x-ray reflectivity cannot be applied directly to the QXRR simulations. The present article proposes and discusses models for simulation of QXRR measurements of curved samples, which are applicable for analysis of liquid materials.

Availability note (English)

Available from http://dx.doi.org/10.1088/1757-899X/24/1/012014

Additional details

Identifiers

DOI
10.1088/1757-899X/24/1/012014;

Publishing Information

Journal Title
IOP Conference Series. Materials Science and Engineering (Online)
Journal Volume
24
Journal Issue
1
Journal Page Range
[13 p.]
ISSN
1757-899X

Conference

Title
Buried interface sciences with X-rays and neutrons 2010
Dates
25-27 Jul 2010
Place
Nagoya (Japan)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43022549
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
INTERFACES; LIQUIDS; MATERIALS; REFLECTIVITY; SIMULATION; SURFACES; X RADIATION
Descriptors DEC
ELECTROMAGNETIC RADIATION; FLUIDS; IONIZING RADIATIONS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIATIONS; SURFACE PROPERTIES