Optical properties change in Te diffused As50Se50 chalcogenide thin film
- 1. Department of Physics, Utkal University, Bhubaneswar, 751004, Odisha (India)
Description
In the present report, we present the effect of Te diffusion into As50Se50 thin film which changes the optical properties. The Te/As50Se50 film was irradiated by a laser beam of 532 nm to study the diffusion mechanism due to photo induced effect. The As50Se50, Te/As50Se50 films show a completely amorphous nature from X-ray diffraction study. A non direct transition was found for these films on the basis of optical transmission data carried out by Fourier Transform infrared Spectroscopy. The optical bandgap is found to be decreased with Te deposition and photo darkening phenomena is observed for the diffused film. The change in the optical constants are well supported by the corresponding change in different types of bonds which are being studied by X-ray photoelectron spectroscopy.
Additional details
Identifiers
- DOI
- 10.1063/1.4947881;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 1731
- Journal Issue
- 1
- Journal Page Range
- vp.
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- DAE solid state physics symposium 2015
- Dates
- 21-25 Dec 2015
- Place
- Uttar Pradesh (India)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48054678
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ARSENIC COMPOUNDS; BEAMS; CHALCOGENIDES; DEPOSITION; DIFFUSION; FOURIER TRANSFORM SPECTROMETERS; FOURIER TRANSFORMATION; IRRADIATION; LASER RADIATION; OPTICAL PROPERTIES; SELENIUM COMPOUNDS; TELLURIUM; TELLURIUM ADDITIONS; THIN FILMS; TRANSMISSION; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- ALLOYS; COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELECTRON SPECTROSCOPY; ELEMENTS; FILMS; INTEGRAL TRANSFORMATIONS; MEASURING INSTRUMENTS; PHOTOELECTRON SPECTROSCOPY; PHYSICAL PROPERTIES; RADIATIONS; SCATTERING; SEMIMETALS; SPECTROMETERS; SPECTROSCOPY; TELLURIUM ALLOYS; TRANSFORMATIONS
Optional Information
- Notes
- (c) 2016 Author(s)