Published October 8, 2004
| Version v1
Journal article
Comparative analysis of nanostructured diblock copolymer films
- 1. Physik Department E13, TU Muenchen, James-Franck-Str. 1, 85748 Garching (Germany)
- 2. Inst. fuer Polymerforschung Dresden e.V., Hohe Str. 6, 01069 Dresden (Germany)
- 3. ESRF, BP 220, 38043 Grenoble Cedex (France)
- 4. TU Muenchen, LS Physik Weihenstephan, Voettinger Strasse 40, 85350 Freising (Germany)
- 5. HASYLAB at DESY, Notkestr. 85, 22603 Hamburg (Germany)
Description
Nanostructured polymer films of poly(styrene-block-paramethylstyrene) diblock copolymers P(Sd-b-pMS) on silicon substrates with a native oxide layer are investigated. Resulting from a storage under toluene vapor, a surface structure is installed. The early stages, characterized by the creation of a host structure out of an initially continuous film, are addressed. Grazing incidence small-angle X-ray scattering (GISAXS) experiments were performed as a function of exposure time. Results are compared to modelling of the scattering pattern and other experimental techniques, such as grazing incidence small-angle neutron scattering (GISANS) and atomic force microscopy (AFM) data. Possibilities and limits of the techniques are discussed
Additional details
Identifiers
- DOI
- 10.1016/j.sab.2004.07.019;
- PII
- S0584-8547(04)00218-6;
Publishing Information
- Journal Title
- Spectrochimica Acta. Part B, Atomic Spectroscopy
- Journal Volume
- 59
- Journal Issue
- 10-11
- Journal Page Range
- p. 1789-1797
- ISSN
- 0584-8547
- CODEN
- SAASBH
Conference
- Title
- 17. International congress on X-ray optics and microanalysis
- Dates
- 22-26 Sep 2003
- Place
- Chamonix (France)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36047595
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; COPOLYMERS; FILMS; LAYERS; NANOSTRUCTURES; NEUTRON DIFFRACTION; OXIDES; SILICON; SMALL ANGLE SCATTERING; STYRENE; SUBSTRATES; SURFACES; TOLUENE; VAPORS; X-RAY DIFFRACTION
- Descriptors DEC
- ALKYLATED AROMATICS; AROMATICS; CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELEMENTS; FLUIDS; GASES; HYDROCARBONS; MICROSCOPY; ORGANIC COMPOUNDS; ORGANIC POLYMERS; OXYGEN COMPOUNDS; POLYMERS; SCATTERING; SEMIMETALS
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.