Published May 2003
| Version v1
Journal article
TMR effects of sputtered Fe-Al-O granular films after irradiation by high energy ions
Description
Fe-Al-O granular films prepared by rf-sputtering were irradiated at room temperature with 1.8 and 2.8 MeV C ions and 2.8 MeV Ge ions to investigate the effects of irradiation-induced defects to the microscopic structure in the film and also the magnetic properties. Using conversion electron Moessbauer spectroscopy, it is observed that the dispersed state of nanosized iron particles is significantly affected by the irradiation at a dose range of 1015-1016 ions/cm2, and that the change in the dispersion results in a decrease of the magnetoresistance ratio. The results suggest that the aggregation of iron particles is promoted by the irradiation
Additional details
Identifiers
- PII
- S0168583X03009121;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 206
- Journal Issue
- 1-4
- Journal Page Range
- p. 1066-1071
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 13. international conference on ion beam modification of materials
- Dates
- 1-6 Sep 2002
- Place
- Kobe (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Egypt
- INIS RN
- 35049616
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AGGLOMERATION; CARBON IONS; FILMS; GRANULAR MATERIALS; ION BEAMS; IRON ALLOYS; IRRADIATION; MAGNETORESISTANCE; MOESSBAUER SPECTROMETERS; PHYSICAL RADIATION EFFECTS; SPUTTERING; TEMPERATURE RANGE 0013-0065 K
- Descriptors DEC
- ALLOYS; BEAMS; CHARGED PARTICLES; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; GAMMA SPECTROMETERS; IONS; MATERIALS; MEASURING INSTRUMENTS; PHYSICAL PROPERTIES; RADIATION EFFECTS; SPECTROMETERS; TEMPERATURE RANGE; TRANSITION ELEMENT ALLOYS
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.