Published March 1, 2011 | Version v1
Journal article

Electron dynamics in the presence of an active medium incorporated in a Penning trap

  • 1. Department of Electrical Engineering, Technion-Israel Institute of Technology, Haifa 32000 (Israel)

Description

Based on an idealized 1D model we demonstrate that electrons oscillating in a Penning trap may get bunched, at the resonant frequency of the active medium. During multiple round trips in the trap, the bunched electrons gain energy and, therefore, they may escape the trap forming a low energy optical injector.

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Applied Physics
Journal Volume
109
Journal Issue
5
Journal Page Range
p. 054907-054907.9
ISSN
0021-8979
CODEN
JAPIAU

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43017164
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
BEAM BUNCHING; ELECTRONS; EMISSION; GAIN; OSCILLATIONS; PARTICLE BEAMS; PENNING EFFECT; SIMULATION; TRAPS
Descriptors DEC
AMPLIFICATION; BEAM DYNAMICS; BEAMS; DYNAMICS; ELEMENTARY PARTICLES; FERMIONS; LEPTONS; MECHANICS

Optional Information

Notes
(c) 2011 American Institute of Physics