Published May 4, 2015 | Version v1
Journal article

Graphite edge controlled registration of monolayer MoS2 crystal orientation

  • 1. Department of Physics, National Taiwan University, Taipei 10617, Taiwan (China)
  • 2. Institute of Atomic and Molecular Sciences, Academia Sinica, Taipei 10617, Taiwan (China)

Description

Transition metal dichalcogenides such as the semiconductor MoS2 are a class of two-dimensional crystals. The surface morphology and quality of MoS2 grown by chemical vapor deposition are examined using atomic force and scanning tunneling microscopy techniques. By analyzing the moiré patterns from several triangular MoS2 islands, we find that there exist at least five different superstructures and that the relative rotational angles between the MoS2 adlayer and graphite substrate lattices are typically less than 3°. We conclude that since MoS2 grows at graphite step-edges, it is the edge structure which controls the orientation of the islands, with those growing from zig-zag (or armchair) edges tending to orient with one lattice vector parallel (perpendicular) to the step-edge

Additional details

Identifiers

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
106
Journal Issue
18
Journal Page Range
p. 181904-181904.4
ISSN
0003-6951
CODEN
APPLAB

Optional Information

Notes
(c) 2015 Author(s)