High-stability reflective bonding pads for GaN-based flip-chip light-emitting diodes packaged by reflow soldering
Creators
- 1. Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan 430074 (China)
Description
We provide a detailed insight into the effects of metal bonding pads on the performance of GaN-based flip-chip blue light-emitting diodes. The flip-chip blue light-emitting diodes with four kinds of reflective bonding pads were fabricated and compared. During the chip package process by reflow soldering, different bonding pads exhibited distinct voidage and bonding force with the solder layers on Cu-coated AlN ceramic substrates. Compared with other samples in this work, the packaged chips with Ti/Al/Ti/Pt/Au bonding pads showed the lowest voidage of 15.48% and thermal resistance, resulting in the highest bonding shear force and light output power. Meanwhile, the optical power of these samples with Ti/Al/Ti/Pt/Au bonding pads only exhibited a degradation rate of 1.8% after accelerated ageing at 100 °C for more than 1000 h. It is concluded that GaN-based flip-chip light-emitting diodes with such Ti/Al/Ti/Pt/Au bonding pads bear good mechanical stability, excellent thermal performance and long-term reliability. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1361-6463/ab1891Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. D, Applied Physics
- Journal Volume
- 52
- Journal Issue
- 26
- Journal Page Range
- [7 p.]
- ISSN
- 0022-3727
- CODEN
- JPAPBE
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52051971
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ALUMINIUM NITRIDES; CERAMICS; COMPARATIVE EVALUATIONS; GALLIUM NITRIDES; LAYERS; LIGHT EMITTING DIODES; RELIABILITY; SOLDERING; SUBSTRATES
- Descriptors DEC
- ALUMINIUM COMPOUNDS; EVALUATION; FABRICATION; GALLIUM COMPOUNDS; JOINING; NITRIDES; NITROGEN COMPOUNDS; PNICTIDES; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; WELDING