Published 1996
| Version v1
Book
X-ray detectors with micron resolution on the basis of Kumakhov optics
Creators
- 1. Inst. for Roentgen Optics, Moscow (Russian Federation)
Description
The spatial resolution of the modern X-ray and neutron detectors is due to emission of secondary particles. For fast X-rays (E = 20 keV) this limit is connected with a range of secondary electrons and usually resolution is 20 microns; for neutrons--limit is connected with a range of α-particles and a resolution is 50 microns. It was shown that polycapillary Kumakhov optics can avoid this limit. The authors have carried out experiments on realization of this idea
Additional details
Publishing Information
- Publisher
- Society of Photo-Optical Instrumentation Engineers.
- Imprint Place
- Bellingham, WA (United States)
- ISBN
- 0-8194-2247-9
- Imprint Title
- Hard x-ray/gamma-ray and neutron optics, sensors, and applications
- Imprint Pagination
- 331 p.
- Series
- Proceedings/SPIE, Volume 2859.
- Journal Page Range
- p. 263-268.
Conference
- Title
- 1. conference on space processing of materials, at SPIE International Society for Optical Engineering (SPIE) annual international symposium on optical science, engineering, and instrumentation.
- Acronym
- Denver '96
- Dates
- 4-9 Aug 1996.
- Place
- Denver, CO (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 28076615
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- EXPERIMENTAL DATA; OPTICAL SYSTEMS; RADIATION DETECTORS; SPATIAL RESOLUTION; THEORETICAL DATA; X-RAY DETECTION
- Descriptors DEC
- DATA; DETECTION; INFORMATION; MEASURING INSTRUMENTS; NUMERICAL DATA; RADIATION DETECTION; RESOLUTION
Optional Information
- Secondary number(s)
- CONF-960848--.