Deuterium retention and morphological modifications of the surface in five grades of tungsten after deuterium plasma exposure
Creators
Description
Highlights: • D retention for used W grades varies by more than one order of magnitude. • Hydrogen loading-induced damaging manifests in surface modifications and retention. • Effects of plasma flux on retention and surface modifications are discussed. • Higher fluxes produce more severe hydrogen loading-induced damaging. - Abstract: Five tungsten (W) grades were simultaneously exposed to deuterium (D) plasma with 1020 D/(m2 s) of 38 eV/D up to 1026 D/m2 at 500 K specimen temperature. The D inventories and their depth profiles within the topmost 12 μm were determined by nuclear reaction analysis (D(3He, p)α). Morphological modifications at and below the surface were analysed by confocal laser scanning microscopy and scanning electron microscopy assisted by focused ion beam cross-sectioning. The observed variation of the D inventory by more than one order of magnitude (0.5–15 × 1020 D/m2) is attributed only to the different properties of each W grade. Spherical blisters and stepped flat-topped extrusions are observed depending on the W grade. These modifications are interpreted as an indication for hydrogen loading-induced damaging. The exposure conditions and W grades were chosen to allow a comparison between published data sets
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jnucmat.2014.05.018Additional details
Identifiers
- DOI
- 10.1016/j.jnucmat.2014.05.018;
- PII
- S0022-3115(14)00285-2;
Publishing Information
- Journal Title
- Journal of Nuclear Materials
- Journal Volume
- 452
- Journal Issue
- 1-3
- Journal Page Range
- p. 248-256
- ISSN
- 0022-3115
- CODEN
- JNUMAM
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46103951
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- DEUTERIUM; HYDROGEN; ION BEAMS; NUCLEAR REACTION ANALYSIS; SCANNING ELECTRON MICROSCOPY; SURFACES; TUNGSTEN
- Descriptors DEC
- BEAMS; CHEMICAL ANALYSIS; ELECTRON MICROSCOPY; ELEMENTS; HYDROGEN ISOTOPES; ISOTOPES; LIGHT NUCLEI; METALS; MICROSCOPY; NONDESTRUCTIVE ANALYSIS; NONMETALS; NUCLEI; ODD-ODD NUCLEI; REFRACTORY METALS; STABLE ISOTOPES; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.