Published 2013
| Version v1
Book
Comparison of characteristics of fault-tolerant logic made according to 65 nm bulk silicon technology and SOI 0,25 μm technology
Creators
- 1. NII Sistemnykh Issledovanij RAN, Moscow (Russian Federation)
Description
no abstract available
Additional details
Additional titles
- Original title (Russian)
- Сравнение характеристик сбоеустойчивой логики, выполненной по технологии обьемного кремния 65 нм и технологии KNI 0,25 мкм
Publishing Information
- Publisher
- NIYaU MIFI
- Imprint Place
- Moscow (Russian Federation)
- ISBN
- 978-5-7262-1786-4
- Imprint Title
- Scientific session of NRNU MEPHI-2013. Abstracts. In three volumes. Volume 1. Innovative nuclear technologies. High technologies in medicine
- Imprint Pagination
- 300 p.
- Journal Page Range
- p. 127
Conference
- Title
- Scientific session of NRNU MEPHI-2013
- Original Conference Title
- Nauchnaya sessiya NIYaU MIFI-2013
- Dates
- 2013
- Place
- Moscow (Russian Federation)
INIS
- Country of Publication
- Russian Federation
- Country of Input or Organization
- Russian Federation
- INIS RN
- 45109456
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- No Abstract, Conference
- Descriptors DEI
- CHARGED PARTICLES; COMPARATIVE EVALUATIONS; LOGIC CIRCUITS; MICROPROCESSORS; RADIATION EFFECTS; SEMICONDUCTOR MATERIALS
- Descriptors DEC
- ELECTRONIC CIRCUITS; EVALUATION; MATERIALS; MICROELECTRONIC CIRCUITS
Optional Information
- Notes
- Imprint:Nauchnaya sessiya NIYaU MIFI-2013. Annotatsii dokladov. V 3-kh tomakh. Tom 1. Innovatsionnye yadernye tekhnologii. Vysokie tekhnologii v meditsine