Superconductivity and low-temperature transport in novel microfabricated aluminum structures
Description
Measurements on three novel microfabricated aluminum thin film systems are discussed. First, a long-range proximity effect is reported in a system whose transition temperature is spatially modulated. The characteristic range of the proximity effect observed is over an order of magnitude greater than that predicted by current theories. Second, an anomalous peak was observed in the resistive transition of superconductive-normal-superconductive (S-N-S) structures. This is a previously unobserved effect. Third, the study of free-standing films is presented. By fitting magnetoresistance data to theoretical models, the inelastic scattering rate as a function of temperature was determined. The expected signature of reduced phonon dimensionality was not seen, suggesting that electron-phonon scattering in thin films may be more complicated than is currently thought
Availability note (English)
University Microfilms, PO Box 1764, Ann Arbor, MI 48106, Order No.92-11,277.Additional details
Publishing Information
- Publisher
- Cornell Univ.
- Imprint Place
- Ithaca, NY (United States)
- Imprint Pagination
- 110 p.
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 24014180
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Thesis, Non-conventional Literature
- Descriptors DEI
- ALUMINIUM; ELECTRON-PHONON COUPLING; FABRICATION; INELASTIC SCATTERING; MAGNETORESISTANCE; PROXIMITY EFFECT; SUPERCONDUCTING FILMS; SUPERCONDUCTIVITY; THIN FILMS
- Descriptors DEC
- COUPLING; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; ELEMENTS; FILMS; METALS; PHYSICAL PROPERTIES; SCATTERING