Published May 1989 | Version v1
Journal article

First interlayer spacing of Ta(100) determined by photoelectron diffraction

  • 1. Department of Physics and Astronomy, Rutgers University, Piscataway, New Jersey 08855-0849

Description

A photoelectron diffraction study of Ta(100), employing the surface shifted 4 f core levels, has been performed to determine its first interplanar spacing. Photoemission intensities of the bulk and surface shifted 4 f core levels were measured as a function of photon energy at normal emission and near the <111> symmetry direction of the crystal. The binding energy of 21.7 eV (23.6 eV) for the bulk 4 f 7/2 (5/2) core level, and the large surface core level shift of 0.75 eV, result in well-resolved peaks in the photoemission spectra with areas that are easily measured independently. We find that the ratio of the surface to bulk core level intensities at normal emission exhibits large oscillations as a function of photon energy due to diffraction effects. Intensity modulation is also seen in the off-normal intensities, but the magnitude is much smaller. We have performed a multiple-scattering photoemission calculation for several first interlayer spacings ranging from the bulk value to a 15% contraction. The best agreement with experiment was obtained for a 10% +- 3% contraction of the first interlayer spacing, which is consistent with an earlier low-energy electron diffraction study

Additional details

Publishing Information

Journal Title
Journal of Vacuum Science and Technology, A
Journal Volume
7
Journal Issue
3
Series
J. Vac. Sci. Technol., A.
Journal Page Range
1931-1936
ISSN
0734-2101
CODEN
JVTAD

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
20051666
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Numerical Data
Descriptors DEI
CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; EXPERIMENTAL DATA; F STATES; GEOMETRY; LATTICE PARAMETERS; LAYERS; N SHELL; PHOTOELECTRON SPECTROSCOPY; TANTALUM
Descriptors DEC
COHERENT SCATTERING; DATA; DIFFRACTION; ELECTRON SPECTROSCOPY; ELECTRONIC STRUCTURE; ELEMENTS; ENERGY LEVELS; INFORMATION; MATHEMATICS; METALS; NUMERICAL DATA; SCATTERING; SPECTROSCOPY; TRANSITION ELEMENTS