Published July 2010 | Version v1
Journal article

Dependence of photoluminescence spectra of epitaxial Pb1-xEuxTe (0 ≤ x ≤ 0.1) alloy layers on conditions of growth

  • 1. Russian Academy of Sciences, Lebedev Physical Institute (Russian Federation)
  • 2. Swiss Federal Institute of Technology, Thin Film Physics Group, Laboratory for Solid State Physics (Switzerland)

Description

The photoluminescence spectra of the Pb1-xEuxTe (0 ≤ x ≤ 0.1) alloy are studied at low temperatures. Epitaxial layers were grown by molecular-beam epitaxy at different temperatures. Along with the basic line corresponding to interband radiative recombination, additional emission lines are observed in the low-energy region of the spectra. Some nonuniformities are observed at the sample surface (within an area smaller than 1% of the total surface area). The concentration and size (1-10 μm) of the nonuniformities decrease with increasing temperature of growth. The additional emission lines are attributed to local nonuniformities in the layer. The dependence of the band gap of the Pb1-xEuxTe (0 ≤ x ≤ 0.1) alloy on the composition parameter x is determined at 77.4 K. The dependence is nonlinear and adequately described by the relation Eg [eV] = 0.213 + 4.8x - 18.4x2.

Additional details

Identifiers

Publishing Information

Journal Title
Semiconductors
Journal Volume
44
Journal Issue
7
Journal Page Range
p. 861-866
ISSN
1063-7826
CODEN
SMICES

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43040082
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ALLOYS; AUGMENTATION; LAYERS; MOLECULAR BEAM EPITAXY; PHOTOLUMINESCENCE; RECOMBINATION; SPECTRA; SURFACE AREA; SURFACES; TEMPERATURE RANGE 0065-0273 K
Descriptors DEC
CRYSTAL GROWTH METHODS; EMISSION; EPITAXY; LUMINESCENCE; PHOTON EMISSION; SURFACE PROPERTIES; TEMPERATURE RANGE

Optional Information

Copyright
Copyright (c) 2010 Pleiades Publishing, Ltd.