Dependence of photoluminescence spectra of epitaxial Pb1-xEuxTe (0 ≤ x ≤ 0.1) alloy layers on conditions of growth
- 1. Russian Academy of Sciences, Lebedev Physical Institute (Russian Federation)
- 2. Swiss Federal Institute of Technology, Thin Film Physics Group, Laboratory for Solid State Physics (Switzerland)
Description
The photoluminescence spectra of the Pb1-xEuxTe (0 ≤ x ≤ 0.1) alloy are studied at low temperatures. Epitaxial layers were grown by molecular-beam epitaxy at different temperatures. Along with the basic line corresponding to interband radiative recombination, additional emission lines are observed in the low-energy region of the spectra. Some nonuniformities are observed at the sample surface (within an area smaller than 1% of the total surface area). The concentration and size (1-10 μm) of the nonuniformities decrease with increasing temperature of growth. The additional emission lines are attributed to local nonuniformities in the layer. The dependence of the band gap of the Pb1-xEuxTe (0 ≤ x ≤ 0.1) alloy on the composition parameter x is determined at 77.4 K. The dependence is nonlinear and adequately described by the relation Eg [eV] = 0.213 + 4.8x - 18.4x2.
Additional details
Identifiers
Publishing Information
- Journal Title
- Semiconductors
- Journal Volume
- 44
- Journal Issue
- 7
- Journal Page Range
- p. 861-866
- ISSN
- 1063-7826
- CODEN
- SMICES
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43040082
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALLOYS; AUGMENTATION; LAYERS; MOLECULAR BEAM EPITAXY; PHOTOLUMINESCENCE; RECOMBINATION; SPECTRA; SURFACE AREA; SURFACES; TEMPERATURE RANGE 0065-0273 K
- Descriptors DEC
- CRYSTAL GROWTH METHODS; EMISSION; EPITAXY; LUMINESCENCE; PHOTON EMISSION; SURFACE PROPERTIES; TEMPERATURE RANGE
Optional Information
- Copyright
- Copyright (c) 2010 Pleiades Publishing, Ltd.