Band gap engineering of ZnMnO diluted magnetic semiconductor by alloying with ZnS
Creators
- 1. Nano-Information Technology Academy (NITA), Dongguk University, Seoul 100-715 (Korea, Republic of)
- 2. Quantum-Functional Semiconductor Research Center, Dongguk University, Seoul 100-715 (Korea, Republic of)
- 3. Department of Chemistry, Dongguk University, Seoul 100-715 (Korea, Republic of)
Description
Highlights: • The effect of the sulfur dopant concentration on the structural, optical and magnetic properties. • Band gap energy of the films decreases from 3.2 eV to 2.96 eV with increasing the sulfur dopant concentration. • The SQUID and Hall Effect measurements demonstrate the room temperature ferromagnetism in the sulfur doped ZnMnO thin films. In this paper we report the results on the fabrication of diluted magnetic semiconductors Zn1−xMnxO1−ySy thin films with manganese x = 0.05 and sulfur 0 ≤ y ≤ 0.15 compositions, respectively, by using ultrasonic spray pyrolysis method. The influence of the sulfur concentration on the band gap energy, structural and magnetic properties have been studied by using optical transmission, X-ray diffraction and superconducting quantum interference device (SQUID) measurements, respectively. The morphology and composition of samples were studied by using Scanning Electron Microscope (SEM) and X-ray photoelectron spectroscopy (XPS). With increasing of the sulfur concentration the band gap energy of composition decreases, while the magnetization increases proportional to the sulfur concentration.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jmmm.2017.09.043Additional details
Identifiers
- DOI
- 10.1016/j.jmmm.2017.09.043;
- PII
- S0304885317325362;
Publishing Information
- Journal Title
- Journal of Magnetism and Magnetic Materials
- Journal Volume
- 446
- Journal Page Range
- p. 206-209
- ISSN
- 0304-8853
- CODEN
- JMMMDC
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 53014591
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALLOYS; DOPED MATERIALS; FABRICATION; FERROMAGNETISM; HALL EFFECT; MAGNETIC PROPERTIES; MAGNETIC SEMICONDUCTORS; MANGANESE; PYROLYSIS; SCANNING ELECTRON MICROSCOPY; SULFUR; TEMPERATURE RANGE 0273-0400 K; THIN FILMS; ULTRASONIC WAVES; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY; ZINC OXIDES; ZINC SULFIDES
- Descriptors DEC
- CHALCOGENIDES; CHEMICAL REACTIONS; COHERENT SCATTERING; DECOMPOSITION; DIFFRACTION; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELEMENTS; FILMS; INORGANIC PHOSPHORS; MAGNETISM; MATERIALS; METALS; MICROSCOPY; NONMETALS; OXIDES; OXYGEN COMPOUNDS; PHOSPHORS; PHOTOELECTRON SPECTROSCOPY; PHYSICAL PROPERTIES; SCATTERING; SEMICONDUCTOR MATERIALS; SOUND WAVES; SPECTROSCOPY; SULFIDES; SULFUR COMPOUNDS; TEMPERATURE RANGE; THERMOCHEMICAL PROCESSES; TRANSITION ELEMENTS; ZINC COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2017 Elsevier B.V. All rights reserved.