The role of MFM signal in mark size measurement in probe-based magnetic recording on CoNi/Pt multilayers
- 1. Department of Applied Physics, University of Electronic Science and Technology of China, Chengdu 610054 (China)
- 2. Data Storage Systems Center, Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA 15213 (United States)
- 3. Systems and Materials for Information Storage Group, MESA Research Institute, University of Twente, P.O. Box 217, 7500 AE Enschede (Netherlands)
Description
A method of heat-assisted magnetic recording (HAMR) potentially suitable for probe-based storage systems is characterized. Magnetic marks were formed by a scanning tunneling microscopy (STM)-based thermal magnetic mechanism on a perpendicular CoNi/Pt multilayered film. Magnetic force microscopy (MFM) was applied to display those marks. The MFM signal is dependent of the lift-height during MFM scanning: smaller lift-height leads to higher resolution of the MFM image and a double-peak signal line, while higher lift-height leads to lower resolution and a single-peak signal line. Theoretical calculation of the magnetic field from the mark was executed. It agrees well with experiments, and demonstrates the method of mark size measurement in perpendicular media: full-width half-maximum (FWHM) of the measured MFM signal
Additional details
Identifiers
- DOI
- 10.1016/j.physb.2006.04.028;
- PII
- S0921-4526(06)00851-9;
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 387
- Journal Issue
- 1-2
- Journal Page Range
- p. 328-332
- ISSN
- 0921-4526
- CODEN
- PHYBE3
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38076601
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- COBALT; FILMS; INTERFACES; LAYERS; MAGNETIC FIELDS; MAGNETIC STORAGE DEVICES; NICKEL; PLATINUM; RESOLUTION; SCANNING TUNNELING MICROSCOPY
- Descriptors DEC
- ELEMENTS; MEMORY DEVICES; METALS; MICROSCOPY; PLATINUM METALS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.