Published January 1, 2007 | Version v1
Journal article

The role of MFM signal in mark size measurement in probe-based magnetic recording on CoNi/Pt multilayers

  • 1. Department of Applied Physics, University of Electronic Science and Technology of China, Chengdu 610054 (China)
  • 2. Data Storage Systems Center, Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA 15213 (United States)
  • 3. Systems and Materials for Information Storage Group, MESA Research Institute, University of Twente, P.O. Box 217, 7500 AE Enschede (Netherlands)

Description

A method of heat-assisted magnetic recording (HAMR) potentially suitable for probe-based storage systems is characterized. Magnetic marks were formed by a scanning tunneling microscopy (STM)-based thermal magnetic mechanism on a perpendicular CoNi/Pt multilayered film. Magnetic force microscopy (MFM) was applied to display those marks. The MFM signal is dependent of the lift-height during MFM scanning: smaller lift-height leads to higher resolution of the MFM image and a double-peak signal line, while higher lift-height leads to lower resolution and a single-peak signal line. Theoretical calculation of the magnetic field from the mark was executed. It agrees well with experiments, and demonstrates the method of mark size measurement in perpendicular media: full-width half-maximum (FWHM) of the measured MFM signal

Additional details

Identifiers

DOI
10.1016/j.physb.2006.04.028;
PII
S0921-4526(06)00851-9;

Publishing Information

Journal Title
Physica. B, Condensed Matter
Journal Volume
387
Journal Issue
1-2
Journal Page Range
p. 328-332
ISSN
0921-4526
CODEN
PHYBE3

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38076601
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
COBALT; FILMS; INTERFACES; LAYERS; MAGNETIC FIELDS; MAGNETIC STORAGE DEVICES; NICKEL; PLATINUM; RESOLUTION; SCANNING TUNNELING MICROSCOPY
Descriptors DEC
ELEMENTS; MEMORY DEVICES; METALS; MICROSCOPY; PLATINUM METALS; TRANSITION ELEMENTS

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.