Published July 2016 | Version v1
Journal article

The effect of roughness model on scattering properties of ice crystals

Description

We compare stochastic models of microscale surface roughness assuming uniform and Weibull distributions of crystal facet tilt angles to calculate scattering by roughened hexagonal ice crystals using the geometric optics (GO) approximation. Both distributions are determined by similar roughness parameters, while the Weibull model depends on the additional shape parameter. Calculations were performed for two visible wavelengths (864 nm and 410 nm) for roughness values between 0.2 and 0.7 and Weibull shape parameters between 0 and 1.0 for crystals with aspect ratios of 0.21, 1 and 4.8. For this range of parameters we find that, for a given roughness level, varying the Weibull shape parameter can change the asymmetry parameter by up to about 0.05. The largest effect of the shape parameter variation on the phase function is found in the backscattering region, while the degree of linear polarization is most affected at the side-scattering angles. For high roughness, scattering properties calculated using the uniform and Weibull models are in relatively close agreement for a given roughness parameter, especially when a Weibull shape parameter of 0.75 is used. For smaller roughness values, a shape parameter close to unity provides a better agreement. Notable differences are observed in the phase function over the scattering angle range from 5° to 20°, where the uniform roughness model produces a plateau while the Weibull model does not. - Highlights: • We compare scattering by hexagonal crystals for uniform and Weibull roughness models. • The Weibull shape parameter has a stronger effect on the phase function at backscattering. • DoLP is mostly affected at the side-scattering angles. • For high roughness, the two models are in relatively close agreement for a given roughness. • A plateau from 5° to 20° is observed in the phase function when using the uniform model.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jqsrt.2016.03.001

Additional details

Identifiers

DOI
10.1016/j.jqsrt.2016.03.001;
PII
S0022-4073(15)30157-6;

Publishing Information

Journal Title
Journal of Quantitative Spectroscopy and Radiative Transfer
Journal Volume
178
Journal Page Range
p. 134-141
ISSN
0022-4073
CODEN
JQSRAE

Conference

Title
15. electromagnetic and light scattering conference: Celebrating 150 years of Maxwell's electromagnetics
Acronym
ELS-XV
Dates
21-26 Jun 2015
Place
Leipzig (Germany)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
48010747
Subject category
S73: NUCLEAR PHYSICS AND RADIATION PHYSICS; S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ASPECT RATIO; ASYMMETRY; BACKSCATTERING; COMPARATIVE EVALUATIONS; CRYSTALS; DISTRIBUTION; GEOMETRY; ICE; OPTICS; POLARIZATION; ROUGHNESS; SHAPE; STOCHASTIC PROCESSES; SURFACES; WAVELENGTHS
Descriptors DEC
DIMENSIONLESS NUMBERS; EVALUATION; MATHEMATICS; SCATTERING; SURFACE PROPERTIES

Optional Information

Copyright
Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.