Deuterium interactions with ion-implanted oxygen in Cu and Au
Creators
- 1. Sandia National Lab., Albuqerque, NM (USA)
- 2. Sandia National Lab., Livermore, CA (USA)
Description
This paper reports the interactions of deuterium (D) with oxygen in Cu and Au examined using ion implantation, nuclear-reaction analysis, and transmission electron microscopy. In Cu, the reduction of Cu2O precipitates by D to produce D20 was shown to occur readily down to room temperature, at a rate limited by the transport of D to the oxides. The reverse process of D20 dissociation was characterized for the first time below the temperature range of steam blistering. The evolution of the Cu(D)-Cu2O-D20 system is shown to be predicted by a newly extended transport formalism encompassing phase changes, trapping, diffusion, and surface release. In Au, buried O sinks were used to measure the permeability of D at 573 and 373 K, thereby extending the range of measured permeabilities downward by about six orders or magnitude
Additional details
Publishing Information
- Publisher
- Materials Research Society.
- Imprint Place
- Pittsburgh, PA (USA)
- ISBN
- 1-55899-001-1
- Imprint Title
- Processing and characterization of materials using ion beams
- Imprint Pagination
- 762 p.
- Series
- Materials Research Society symposium proceedings. Volume 128.
- Journal Page Range
- p. 309-314.
Conference
- Title
- Processing and characterization of materials using ion beams.
- Dates
- 28 Nov - 2 Dec 1988.
- Place
- Boston, MA (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 21054979
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS; S74: ATOMIC AND MOLECULAR PHYSICS; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COPPER; DEUTERIUM TARGET; DIFFUSION; GOLD; HEAVY WATER; INTERACTIONS; ION IMPLANTATION; MEASURING METHODS; NUCLEAR REACTION ANALYSIS; OXYGEN; TRANSMISSION ELECTRON MICROSCO
- Descriptors DEC
- CHEMICAL ANALYSIS; ELECTRON MICROSCOPY; ELEMENTS; HYDROGEN COMPOUNDS; METALS; MICROSCOPY; NONDESTRUCTIVE ANALYSIS; NONMETALS; OXYGEN COMPOUNDS; POLAR SOLVENTS; SOLVENTS; TARGETS; TRANSITION ELEMENTS; WATER
Optional Information
- Secondary number(s)
- CONF-8811225--.