Published July 21, 2014 | Version v1
Journal article

Origins of interlayer formation and misfit dislocation displacement in the vicinity of InAs/GaAs quantum dots

  • 1. Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109 (United States)
  • 2. Department of Physics, University of Michigan, Ann Arbor, Michigan 48109 (United States)

Description

We have examined the origins of interlayer formation and misfit dislocation (MD) displacement in the vicinity of InAs/GaAs quantum dots (QDs). For QDs formed by the Stranski-Krastanov mode, regularly spaced MDs nucleate at the interface between the QD and the GaAs buffer layer. In the droplet epitaxy case, both In island formation and In-induced "nano-drilling" of the GaAs buffer layer are observed during In deposition. Upon annealing under As flux, the In islands are converted to InAs QDs, with an InGaAs interlayer at the QD/buffer interface. Meanwhile, MDs nucleate at the QD/interlayer interface.

Additional details

Identifiers

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
105
Journal Issue
3
Journal Page Range
p. 032107-032107.4
ISSN
0003-6951
CODEN
APPLAB

Optional Information

Notes
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