Published January 11, 2007 | Version v1
Journal article

Status of the integration of the Tracker Inner Barrel of CMS

Creators

  • 1. Universita di Pisa and INFN sezione di Pisa, Pisa (Italy)

Description

The CMS Silicon Strip Tracker is the largest tracking system made of silicon devices ever built for a High Energy Physics experiment. Such a complex detector required a long time for the production and qualification of each component and a system test to verify that the expected performance is achieved. The Tracker Inner Barrel (TIB) is the central sub-detector consisting of four cylindrical layers coaxial with the beam line. The status of construction of the TIB will be described, focusing on the procedures defined to assemble the hardware components and on the tests performed during the integration to check for their functionality. The database system used to select the components and keep track of them is also briefly described. The performance of a TIB subsystem read-out with the final DAQ has been analysed in different operating conditions and preliminary results are presented

Additional details

Identifiers

DOI
10.1016/j.nima.2006.09.059;
PII
S0168-9002(06)01588-9;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
570
Journal Issue
2
Journal Page Range
p. 253-257
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
7. international conference on large scale applications and radiation hardness of semiconductor detectors
Dates
5-7 Oct 2006
Place
Florence (Italy)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38092000
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BEAMS; CYLINDRICAL CONFIGURATION; EQUIPMENT; HIGH ENERGY PHYSICS; PARTICLE TRACKS; PERFORMANCE; POSITION SENSITIVE DETECTORS; READOUT SYSTEMS; SI SEMICONDUCTOR DETECTORS
Descriptors DEC
CONFIGURATION; MEASURING INSTRUMENTS; PHYSICS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.