Effect of ZnO doping on microstructural and electrical properties of SnO2–Ta2O5 based varistors
- 1. School of Engineering and Technology, China University of Geosciences, Beijing 100083 (China)
- 2. School of Science, Beijing University of Posts and Telecommunications, Beijing 100876 (China)
Description
Highlights: ► SnO2–Ta2O5–ZnO varistors. ► Doping effect of ZnO on SnO2–Ta2O5 based varistors. ► Optimizing doping of ZnO in SnO2–Ta2O5 based varistors. - Abstract: SnO2–Ta2O5 based varistors doped with 0–2.0 mol% of ZnO were prepared by sintering the samples at 1450 °C for 2 h with conventional ceramic processing method. The doping effect of ZnO on the microstructural and electrical properties of the as-prepared SnO2–Ta2O5 based varistor ceramics was investigated. The change in SnO2 lattice parameter and EDX analysis both confirmed the doping of Zn ions into SnO2 grains, although the identified phase was only SnO2 (cassiterite) by X-ray diffraction in detection limit. The microstructure observation indicated that the doped ZnO can facilitate the sintering of the varistor ceramics. The measured electric-field/current-density characteristics of the samples revealed that the nonlinear exponents and varistor voltage increased with increasing doping amount of ZnO when the ZnO content was no more than 0.5 mol%; and more addition of ZnO would cause a decrease in nonlinear exponent and varistor voltage of the ceramic varistors.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jallcom.2012.02.172Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2012.02.172;
- PII
- S0925-8388(12)00461-6;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 528
- Journal Page Range
- p. 79-83
- ISSN
- 0925-8388
- CODEN
- JALCEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43103089
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CERAMICS; CURRENT DENSITY; DOPED MATERIALS; ELECTRIC FIELDS; ELECTRICAL PROPERTIES; LATTICE PARAMETERS; MICROSTRUCTURE; NONLINEAR PROBLEMS; SEMICONDUCTOR RESISTORS; SENSITIVITY; SINTERING; TANTALUM OXIDES; TIN OXIDES; X-RAY DIFFRACTION; ZINC OXIDES
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTRICAL EQUIPMENT; EQUIPMENT; FABRICATION; MATERIALS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; REFRACTORY METAL COMPOUNDS; RESISTORS; SCATTERING; SEMICONDUCTOR DEVICES; TANTALUM COMPOUNDS; TIN COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; ZINC COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.