Published February 1, 1988
| Version v1
Journal article
Asymmetric X-ray line broadening of plastically deformed crystals. Pt. 1
Creators
- 1. Eoetvoes Lorand Tudomanyegyetem, Budapest (Hungary). Inst. of General Physics
- 2. Max-Planck-Institut fuer Metallforschung, Stuttgart (Germany, F.R.). Inst. fuer Physik
Description
X-ray diffraction line profiles of plastically deformed Cu single crystals orientated for ideal multiple slip were recently found to be markedly asymmetric. A theory is developed to interpret this kind of asymmetric line broadening in terms of the average dislocation density, the dipole polarization of the dislocation structure and the mean square fluctuation of the dislocation density. (orig.)
Additional details
Additional titles
- Subtitle (English)
- Theory
Publishing Information
- Journal Title
- J. Appl. Crystallogr.
- Journal Volume
- 21
- Journal Issue
- 1
- Series
- J. Appl. Crystallogr.
- Journal Page Range
- 47-53
- ISSN
- 0021-8898
- CODEN
- JACGA
INIS
- Country of Publication
- Denmark
- Country of Input or Organization
- Denmark
- INIS RN
- 19056612
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- COPPER; CORRELATIONS; DEFORMATION; DIPOLES; DISLOCATIONS; FLUCTUATIONS; FOURIER ANALYSIS; LINE BROADENING; MATHEMATICAL MODELS; MONOCRYSTALS; PLASTICITY; POLARIZATION; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; CRYSTALS; DIFFRACTION; ELEMENTS; LINE DEFECTS; MECHANICAL PROPERTIES; METALS; MULTIPOLES; SCATTERING; TRANSITION ELEMENTS; VARIATIONS