Published March 2003
| Version v1
Journal article
Cantilever's behavior in the AC mode of an AFM
Description
In this paper, a model with a small number of parameters is used to simulate the motion of a cantilever in the AC mode of an atomic force microscope (AFM). The results elucidate the transition dependence-from noncontact to tapping operating mode-on the height of the contamination layer and on the stiffness of the sample
Additional details
Identifiers
- DOI
- 10.1016/S1044-5803;
- PII
- S1044580303000810;
Publishing Information
- Journal Title
- Materials Characterization
- Journal Volume
- 50
- Journal Issue
- 2-3
- Journal Page Range
- p. 173-177
- ISSN
- 1044-5803
- CODEN
- MACHEX
Conference
- Title
- Brazilian Materials Research Society symposia on current trends in nanostructured materials, semiconductor Materials, thin films, and biomaterials
- Dates
- 7-10 Jul 2002
- Place
- Rio de Janeiro (Brazil)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37057276
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; FLEXIBILITY; LAYERS; THICKNESS; THIN FILMS
- Descriptors DEC
- DIMENSIONS; FILMS; MECHANICAL PROPERTIES; MICROSCOPY; TENSILE PROPERTIES
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.