Published November 22, 2005
| Version v1
Journal article
Self-assembled monolayers of semifluorinated thiols on electrochemically modified polycrystalline nickel surfaces
- 1. Laboratoire Interdisciplinaire de Spectroscopie Electronique, Facultes Universitaires Notre-Dame de la Paix, rue de Bruxelles, 61, B-5000 Namur (Belgium)
- 2. Laboratoire de Chimie des Materiaux Organiques et Metalliques, CMOM, Faculte des Sciences, Universite de Nice-Sophia Antipolis, Parc Valrose, 06108 Nice Cedex 2 (France)
Description
Electrochemically pretreated polycrystalline nickel substrates modified with ethanolic solutions (10-2 and 10-1 M) of four semi-fluorinated thiols with R F-R H-SH structures have been evaluated by X-ray photoelectron spectroscopy, contact angles and cyclic voltammetry measurements. Our results show that it is possible to graft highly fluorinated alkanethiols on nickel surfaces, the quality of the self assembled monolayers depending on the concentration of the dipping solutions, the dipping time as well as the length of the perfluorinated carbon chains and those of the hydrocarbon connector between the perfluorinated fragment and the thiol function
Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2005.06.090;
- PII
- S0040-6090(05)00760-1;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 491
- Journal Issue
- 1-2
- Journal Page Range
- p. 253-259
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37023107
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CONNECTORS; HYDROCARBONS; NICKEL; POLYCRYSTALS; SOLUTIONS; SURFACES; THIOLS; VOLTAMETRY; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CONDUCTOR DEVICES; CRYSTALS; DISPERSIONS; ELECTRICAL EQUIPMENT; ELECTRON SPECTROSCOPY; ELEMENTS; EQUIPMENT; HOMOGENEOUS MIXTURES; METALS; MIXTURES; ORGANIC COMPOUNDS; ORGANIC SULFUR COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; SPECTROSCOPY; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.