Published April 2016 | Version v1
Journal article

Fourier analysis: from cloaking to imaging

  • 1. College of Electronic Science and Technology and Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, Shenzhen University, Shenzhen 518060 (China)
  • 2. College of Science, Huazhong Agricultural University, Wuhan 430070 (China)

Description

Regarding invisibility cloaks as an optical imaging system, we present a Fourier approach to analytically unify both Pendry cloaks and complementary media-based invisibility cloaks into one kind of cloak. By synthesizing different transfer functions, we can construct different devices to realize a series of interesting functions such as hiding objects (events), creating illusions, and performing perfect imaging. In this article, we give a brief review on recent works of applying Fourier approach to analysis invisibility cloaks and optical imaging through scattering layers. We show that, to construct devices to conceal an object, no constructive materials with extreme properties are required, making most, if not all, of the above functions realizable by using naturally occurring materials. As instances, we experimentally verify a method of directionally hiding distant objects and create illusions by using all-dielectric materials, and further demonstrate a non-invasive method of imaging objects completely hidden by scattering layers. (review)

Availability note (English)

Available from http://dx.doi.org/10.1088/2040-8978/18/4/044001

Additional details

Publishing Information

Journal Title
Journal of Optics (Online)
Journal Volume
18
Journal Issue
4
Journal Page Range
[8 p.]
ISSN
2040-8986

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
47080964
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
DIELECTRIC MATERIALS; FOURIER ANALYSIS; IMAGES; LAYERS; REVIEWS; SCATTERING; TRANSFER FUNCTIONS
Descriptors DEC
DOCUMENT TYPES; FUNCTIONS; MATERIALS