Published 1991
| Version v1
Book
Dislocation mechanics based constitutive equations for tungsten deformation and fracturing
- 1. Maryland Univ., College Park, MD (United States). Dept. of Mechanical Engineering
- 2. Research and Technology Dept., Naval Surface Warfare Center, Silver Spring, MD (United States)
Description
In this paper temperature, strain rate, strain hardening and grain size influences are described with the bcc constitutive equation σ = σG + B0exp(-βT) + Kεn + kl-1/2 where σ is an a thermal stress for solutes and initial dislocation density, B0 and β = β0 - β1, kn e are thermal activation parameters, X and n ∼0.5 are strain hardening parameters, k is the Hall-Petch microstructural stress intensity and l is the grain diameter. Uniform strain measurements are used to obtain the strain hardening parameters. The ductile/brittle transition behavior is described by using, also, a Hall-Petch relation for the cleavage fracture stress. The analysis is related to W-7Ni- 3Fe cylinder impact (Taylor) test experiments
Additional details
Publishing Information
- Publisher
- The Metallurgical Society Inc.
- Imprint Place
- Warrendale, PA (United States)
- Imprint Title
- 120th TMS annual meeting
- Imprint Pagination
- 146 p.
- Journal Page Range
- p. 106.
Conference
- Title
- Annual meeting and exhibition of the Minerals, Metals and Materials Society (TMS).
- Dates
- 17-21 Feb 1991.
- Place
- New Orleans, LA (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 23052559
- Subject category
- S36: MATERIALS SCIENCE; S36: MATERIALS SCIENCE; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DUCTILE-BRITTLE TRANSITIONS; EQUATIONS; FRACTURE MECHANICS; GRAIN SIZE; IMPACT TESTS; IRON ALLOYS; MICROSTRUCTURE; NICKEL ALLOYS; STRAIN HARDENING; TEMPERATURE DEPENDENCE; THERMODYNAMICS; TUNGSTEN ALLOYS
- Descriptors DEC
- ALLOYS; CRYSTAL STRUCTURE; HARDENING; MATERIALS TESTING; MECHANICAL TESTS; MECHANICS; SIZE; TESTING
Optional Information
- Secondary number(s)
- CONF-910202--.