Rapid annealing of Au thin films by micron chevron-shaped laser beam scanning toward growth of single-grain crystal
- 1. Shimane University, Department of Physics and Materials Science, Matsue, Shimane (Japan)
- 2. Shimane University, Graduate School of Science and Technology, Matsue, Shimane (Japan)
- 3. Shimane University, Next Generation Tatara Co-creation Centre, Matsue, Shimane (Japan)
Description
A practicable solution to reduce the density of grain boundaries in metal thin films in order to improve their physical properties, and compatibility with nanoscale fabrications still remains a challenge for the thin film industry. We propose an alternative approach to the problem by using micron chevron-shaped laser beam (μCLB) annealing for rapid and selective growth of crystal grains in metal thin films. We investigate the laser annealing of various Au thin films and discuss the mechanisms of grain growth accounting for the microstructure of the Au films and interaction between the Au films and the substrate. The successful growth of single-grain crystal on a 50 nm Au film by μCLB annealing is also demonstrated and further optimization of the process is discussed. (author)
Availability note (English)
Available from DOI: https://doi.org/10.35848/1347-4065/abdf22Additional details
Identifiers
Publishing Information
- Journal Title
- Japanese Journal of Applied Physics (Online)
- Journal Volume
- 60
- Journal Issue
- SB
- Journal Page Range
- p. SBBK06.1-SBBK06.9
- ISSN
- 1347-4065
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 53074161
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CRYSTAL GROWTH; ELECTRIC CONDUCTIVITY; ELECTROCHEMISTRY; ELECTRON DIFFRACTION; GOLD; GRAIN BOUNDARIES; GRAIN ORIENTATION; GRAIN SIZE; LASER RADIATION; MEAN FREE PATH; MOLECULAR BEAM EPITAXY; SCANNING ELECTRON MICROSCOPY; SOLID STATE LASERS; THIN FILMS
- Descriptors DEC
- CHEMISTRY; COHERENT SCATTERING; CRYSTAL GROWTH METHODS; DIFFRACTION; ELECTRICAL PROPERTIES; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELEMENTS; EPITAXY; FILMS; LASERS; METALS; MICROSCOPY; MICROSTRUCTURE; ORIENTATION; PHYSICAL PROPERTIES; RADIATIONS; SCATTERING; SIZE; TRANSITION ELEMENTS
Optional Information
- Notes
- 30 refs., 9 figs.