Simulation study of STS-XYTER front-end electronics in overload situations for the silicon tracking system in the CBM experiment
Description
In high-rate experiments, as the CBM Experiment at FAIR, a situation can occur in which the data rate temporarily exceeds the available bandwidth. With self-triggered front end electronics such overload situations would lead, without further measures, to uncontrolled data losses and potentially a large number of incomplete events. Mechanisms needed to control data losses and to ensure the collection of complete events can be understood via simulations performed with the hardware description language SystemC. Results from simulations of a simplified front-end electronics for the CBM Silicon Tracking System, based on the STS-XYTER ASIC, are presented. Performed simulations give first insight in the behavior of data flow and data losses in the DAQ system of the CBM experiment. Options and solutions for the data throttling mechanisms at beam conditions required by the CBM experiment are discussed.
Additional details
Identifiers
Publishing Information
- Journal Title
- Verhandlungen der Deutschen Physikalischen Gesellschaft
- Journal Issue
- Heidelberg 2015 issue
- Series
- Also available as printed version: Verhandlungen der Deutschen Physikalischen Gesellschaft v. 50(4)
- Journal Page Range
- [1 p.]
- ISSN
- 0420-0195
- CODEN
- VDPEAZ
Conference
- Title
- DPG Spring meeting of the section on atomic, molecular, and plasma physics and quantum optics (SAMOP) together with the divisions hadronic and nuclear physics, environmental physics and working groups industry business, young DPG
- Dates
- 23-27 Mar 2015
- Place
- Heidelberg (Germany)
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 47117392
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COMPUTERIZED SIMULATION; DATA ACQUISITION SYSTEMS; DATA TRANSMISSION; INTEGRATED CIRCUITS; PARTICLE TRACKS; POSITION SENSITIVE DETECTORS; PROGRAMMING LANGUAGES; READOUT SYSTEMS; SI MICROSTRIP DETECTORS
- Descriptors DEC
- COMMUNICATIONS; ELECTRONIC CIRCUITS; MEASURING INSTRUMENTS; MICROELECTRONIC CIRCUITS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS; SIMULATION
Optional Information
- Notes
- Session: HK 31.6 Di 18:15; No further information available
- Collaborations
- CBM-Collaboration