Published 2003 | Version v1
Journal article Metadata-only

Diagnosis of spatial resolution for microbeam scanning PIXE using STIM method and CR-39 track detector in PASTA

Creators

  • 1. National Inst. of Radiological Sciences, Chiba (Japan)
  • 2. Neosteck Co., Chiba (Japan)
  • 3. Toho Univ., Dept. of Physics, Funabashi, Chiba (Japan)

Description

In PIXE analysis system and Tandem Accelerator facility (PASTA) of NIRS, we are using Scanning Transmission Ion Microscopy (STIM) method and solid track detector to diagnose the spatial resolution of scanning microbeam PIXE analysis system. These methods are widely used by many microbeam facilities. (author)

Additional details

Publishing Information

Journal Title
International Journal of PIXE
Journal Volume
13
Journal Issue
1-2
Journal Page Range
p. 37-43
ISSN
0129-0835

Conference

Title
19. symposium on PIXE in Japan
Dates
9-11 Oct 2002
Place
Akita (Japan)

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
36064082
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ATOMIC FORCE MICROSCOPY; BEAM DYNAMICS; BEAM OPTICS; BEAM SCANNERS; ION MICROSCOPY; PHOTOGRAPHIC FILM DETECTORS; PIXE ANALYSIS; PROTON BEAMS; SPATIAL RESOLUTION; TANDEM ELECTROSTATIC ACCELERATORS
Descriptors DEC
ACCELERATORS; BEAM MONITORS; BEAMS; CHEMICAL ANALYSIS; DYNAMICS; ELECTROSTATIC ACCELERATORS; MEASURING INSTRUMENTS; MECHANICS; MICROSCOPY; MONITORS; NONDESTRUCTIVE ANALYSIS; NUCLEON BEAMS; PARTICLE BEAMS; RADIATION DETECTORS; RESOLUTION; X-RAY EMISSION ANALYSIS

Optional Information

Notes
11 refs., 6 figs.