Published January 1, 2017 | Version v1
Book

X rays and matter - 5 - RX 2013

  • 1. IMPMC, Universite Pierre et Marie Curie, CNRS, Paris (France)
  • 2. Institut Pprime - DPMM, CNRS - Universite de Poitiers, ENSMA, Chasseneuil du Poitou (France)
  • 3. DEN/DMN/SRMA/LA2M, CEA Saclay, Gif-sur-Yvette (France)
  • 4. ESRF, Grenoble (France)
  • 5. ICMCB, Universite de Bordeaux - CNRS, Pessac (France)
  • 6. Laboratoire GeoRessource, Universite de Lorraine - CNRS, Nancy (France)
  • 7. LMGP, Grenoble INP - CNRS, Grenoble (France)
  • 8. LEM, CNRS/ONERA, Chatillon (France)
  • 9. IJL, Universite de Lorraine - CNRS, Nancy (France)
  • 10. IPR, Universite de Rennes 1- CNRS, Rennes (France)
  • 11. SPCTS, Universite de Limoges - CNRS, Limoges (France)
  • 12. LTDS, ECL-CNRS, ecully (France)
  • 13. Cirimat, Universite Toulouse III - INP, CNRS, Toulouse (France)
  • 14. DSM/INAC/SP2M/NRS, CEA Grenoble (France)
  • 15. Leme, Universite Paris Ouest, Ville-d'Avray (France)

Description

This book which contains contributions of several authors, is the fifth volume of series which addresses the various aspects of the study of condensed matter by using the interaction between X rays and this matter. The first chapter addresses the concept of diffuse scattering within the general framework of the study of phase transitions as they were presented according to the academic approach by Lev Landau: formalism, relationship of diffuse scattering with the disorder nature, experimental illustration with the case of alkane inclusion compounds in urea. The second chapter recalls the notions of reflection and refraction of X rays, presents the formalism used to study the central scattering signal under grazing incidence, discusses experimental applications of this approach (study of nanometer cavities at the surface of silicon mono-crystals, characterization of nano-particle assemblies embedded in thin layers, self-organised growth of nano-particles). The third chapter addresses the advanced analysis of orientation gradients and stresses by using X ray Laue micro-scattering, and more particularly the study of the coupling between local and micro-mechanical scattering by using a very specific and unique equipment. The fourth chapter addresses the use of high energy synchrotron radiation and in situ scattering of X rays (instrumentation, applications for textures, temperature measurements, mechanical or thermal-mechanical loading, 3D mapping). The fifth chapter addresses the use of X rays for the study of geological materials under high pressures and temperatures, with the application of study of the Earth's core. The sixth chapter describes experimental devices and applications in Earth sciences of used for imagery and elementary composition based on X fluorescence spectrometry. The authors of the seventh chapter outlines the benefit of the use of X ray scattering for the study and optimisation of battery electrode materials. The last chapter describes the contribution of scattering technologies to the elaboration or sheath materials for present and future nuclear reactors

Additional details

Additional titles

Original title (French)
Rayons X et matiere - 5 - RX 2013

Publishing Information

Publisher
ISTE editions
Imprint Place
London (United Kingdom)
ISBN
978-1-78405-308-6
Imprint Pagination
314 p.