X rays and matter - 5 - RX 2013
Creators
- Antonangeli, Daniele1
- Babonneau, David2
- Goudeau, Philippe2
- Bechade, Jean-Luc3
- De Carlan, Yann3
- Menut, Denis3
- Toualbi, Louise3
- Buslaps, Thomas4
- Carlier-Larregaray, Dany5
- Darriet, Jacques5
- Delmas, Claude5
- Guignard, Marie5
- Cauzid, Jean6
- Consonni, Vincent7
- Daveau, Gael8
- Devincre, Benoit8
- Geandier, Guillaume9
- Guerin, Laurent10
- Rabiller, Philippe10
- Toudic, Bertrand10
- Mariette, Celine10
- Guinebretiere, Rene11
- Hoc, Thierry12
- Malard, Benoit13
- Micha, Jean-Sebastien14
- Robach, Odile14
- Ulrich, Olivier14
- Petit, Johann15
- 1. IMPMC, Universite Pierre et Marie Curie, CNRS, Paris (France)
- 2. Institut Pprime - DPMM, CNRS - Universite de Poitiers, ENSMA, Chasseneuil du Poitou (France)
- 3. DEN/DMN/SRMA/LA2M, CEA Saclay, Gif-sur-Yvette (France)
- 4. ESRF, Grenoble (France)
- 5. ICMCB, Universite de Bordeaux - CNRS, Pessac (France)
- 6. Laboratoire GeoRessource, Universite de Lorraine - CNRS, Nancy (France)
- 7. LMGP, Grenoble INP - CNRS, Grenoble (France)
- 8. LEM, CNRS/ONERA, Chatillon (France)
- 9. IJL, Universite de Lorraine - CNRS, Nancy (France)
- 10. IPR, Universite de Rennes 1- CNRS, Rennes (France)
- 11. SPCTS, Universite de Limoges - CNRS, Limoges (France)
- 12. LTDS, ECL-CNRS, ecully (France)
- 13. Cirimat, Universite Toulouse III - INP, CNRS, Toulouse (France)
- 14. DSM/INAC/SP2M/NRS, CEA Grenoble (France)
- 15. Leme, Universite Paris Ouest, Ville-d'Avray (France)
Description
This book which contains contributions of several authors, is the fifth volume of series which addresses the various aspects of the study of condensed matter by using the interaction between X rays and this matter. The first chapter addresses the concept of diffuse scattering within the general framework of the study of phase transitions as they were presented according to the academic approach by Lev Landau: formalism, relationship of diffuse scattering with the disorder nature, experimental illustration with the case of alkane inclusion compounds in urea. The second chapter recalls the notions of reflection and refraction of X rays, presents the formalism used to study the central scattering signal under grazing incidence, discusses experimental applications of this approach (study of nanometer cavities at the surface of silicon mono-crystals, characterization of nano-particle assemblies embedded in thin layers, self-organised growth of nano-particles). The third chapter addresses the advanced analysis of orientation gradients and stresses by using X ray Laue micro-scattering, and more particularly the study of the coupling between local and micro-mechanical scattering by using a very specific and unique equipment. The fourth chapter addresses the use of high energy synchrotron radiation and in situ scattering of X rays (instrumentation, applications for textures, temperature measurements, mechanical or thermal-mechanical loading, 3D mapping). The fifth chapter addresses the use of X rays for the study of geological materials under high pressures and temperatures, with the application of study of the Earth's core. The sixth chapter describes experimental devices and applications in Earth sciences of used for imagery and elementary composition based on X fluorescence spectrometry. The authors of the seventh chapter outlines the benefit of the use of X ray scattering for the study and optimisation of battery electrode materials. The last chapter describes the contribution of scattering technologies to the elaboration or sheath materials for present and future nuclear reactors
Additional details
Additional titles
- Original title (French)
- Rayons X et matiere - 5 - RX 2013
Publishing Information
- Publisher
- ISTE editions
- Imprint Place
- London (United Kingdom)
- ISBN
- 978-1-78405-308-6
- Imprint Pagination
- 314 p.
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- United Kingdom
- INIS RN
- 51108361
- Subject category
- S73: NUCLEAR PHYSICS AND RADIATION PHYSICS; S42: ENGINEERING; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- CLADDING; CRYSTAL STRUCTURE; ELECTRIC BATTERIES; GEOPHYSICS; MATTER; MEASURING INSTRUMENTS; MEASURING METHODS; NANOMATERIALS; NANOPARTICLES; NUCLEAR POWER PLANTS; PHASE TRANSFORMATIONS; SCATTERING; SYNCHROTRON RADIATION; X RADIATION; X-RAY DIFFRACTION; X-RAY FLUORESCENCE ANALYSIS; X-RAY RADIOGRAPHY; X-RAY SPECTROSCOPY
- Descriptors DEC
- BREMSSTRAHLUNG; CHEMICAL ANALYSIS; COHERENT SCATTERING; DEPOSITION; DIFFRACTION; ELECTROCHEMICAL CELLS; ELECTROMAGNETIC RADIATION; ENERGY STORAGE SYSTEMS; ENERGY SYSTEMS; INDUSTRIAL RADIOGRAPHY; IONIZING RADIATIONS; MATERIALS; MATERIALS TESTING; NONDESTRUCTIVE ANALYSIS; NONDESTRUCTIVE TESTING; NUCLEAR FACILITIES; PARTICLES; PHYSICS; POWER PLANTS; RADIATIONS; SCATTERING; SPECTROSCOPY; SURFACE COATING; TESTING; THERMAL POWER PLANTS; X-RAY EMISSION ANALYSIS