Blister evolution time invariance at very low electrolyte pH: H2SO4/graphite system investigated by electrochemical atomic force microscopy
- 1. Department of Physics, Politecnico di Milano, p.za Leonardo da Vinci 32, I-20133, Milano (Italy)
- 2. Department of Chemistry, Materials and Chemical Engineering"Giulio Natta", Politecnico di Milano, v. Mancinelli 7, I-20131, Milano (Italy)
Description
When graphite is immersed in diluted sulfuric acid (H2SO4) electrolyte and positive potentials are applied to the sample, the surface undergoes an incipient oxidation process that develops gases (typically CO, CO2 and O2) both on the surface and in the underneath layers. These gases swell the surface and produce blisters, which damage and degrade the crystal. Some of these mechanisms are still under debate, such as the time interval Δt for blister evolution. Very recently, we studied the required Δt in 1 M H2SO4 electrolyte, finding a critical time for their formation of few seconds. Here, we give evidence that this time interval is almost unchanged if the electrolyte is further diluted until 1 mM, by combining electrochemical-atomic force microscopy, cyclic-voltammetry and normal pulse voltammetry.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.electacta.2018.04.204Additional details
Identifiers
- DOI
- 10.1016/j.electacta.2018.04.204;
- PII
- S0013468618309897;
Publishing Information
- Journal Title
- Electrochimica Acta
- Journal Volume
- 276
- Journal Page Range
- p. 352-361
- ISSN
- 0013-4686
- CODEN
- ELCAAV
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 53034019
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; CARBON DIOXIDE; CARBON MONOXIDE; CRYSTALS; ELECTROCHEMISTRY; ELECTROLYTES; LAYERS; OXIDATION; VOLTAMETRY
- Descriptors DEC
- CARBON COMPOUNDS; CARBON OXIDES; CHALCOGENIDES; CHEMICAL REACTIONS; CHEMISTRY; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2018 Elsevier Ltd. All rights reserved.