Published May 1988
| Version v1
Journal article
Microporosity and adhesion of ion bombarded thin silicon surface films
Creators
- 1. Heidelberg Univ. (Germany, F.R.). Physikalisch-Chemisches Inst.
Description
Adhesion tests and electrochemical measurements were performed on thin silicon films evaporated onto steel to evaluate the influence of ion bombardment on mechanical properties, corrosion protection potential and microporosity. The results are compared to those obtained by a combined process, i.e. ion bombardment during evaporation. (orig.)
Additional details
Publishing Information
- Journal Title
- Nucl. Instrum. Methods Phys. Res., Sect. B
- Journal Volume
- 32
- Journal Issue
- 1-4
- Series
- Nucl. Instrum. Methods Phys. Res., Sect. B.
- Journal Page Range
- 104-110
- ISSN
- 0168-583X
- CODEN
- NIMBE
Conference
- Title
- 4. international conference on radiation effects in insulators - including the workshop on radiation damage in nuclear waste materials.
- Dates
- 6-10 Jul 1987.
- Place
- Lyon (France).
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 19087677
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- ADHESION; ARGON IONS; AUGER ELECTRON SPECTROSCOPY; CHEMICAL COMPOSITION; CORROSION RESISTANCE; EVAPORATION; EXPERIMENTAL DATA; IRRADIATION; KEV RANGE 10-100; KEV RANGE 100-1000; MICROSTRUCTURE; PHYSICAL RADIATION EFFECTS; POROSITY; POTENTIOMETRY; RADIATION DOSES; ROUGHNESS; SILICON; STEELS; THIN FILMS; XENON IONS
- Descriptors DEC
- ALLOYS; CARBON ADDITIONS; CHARGED PARTICLES; CRYSTAL STRUCTURE; DATA; ELECTRON SPECTROSCOPY; ELEMENTS; ENERGY RANGE; FILMS; INFORMATION; IONS; IRON ALLOYS; IRON BASE ALLOYS; KEV RANGE; NUMERICAL DATA; PHASE TRANSFORMATIONS; RADIATION EFFECTS; SEMIMETALS; SPECTROSCOPY; SURFACE PROPERTIES; TITRATION