A simple approach to atom probe sample preparation by using shadow masks

Here, we present a new method that utilises shadow masks in a broad ion beam system to prepare atom probe samples. It is particularly suited to non-conductors and materials with surface layers such as surface oxides, implanted layers or thin films. This new approach bypasses the focused ion beam (FIB) lift-out step, increasing the sample throughput, dramatically reducing the required FIB beam time and decreasing the complexity of sample preparation. - Highlights: • Atom probe samples can be fabricated using a broad ion beam with a shadow mask. • Only a short amount of FIB is required to sharpen the sample. • Samples can be re-used by applying a second shadow mask.