Influence of electrodeposition temperature in the electrochemical properties of Ni(OH)2: An experimental and theoretical study
Creators
- 1. Federal University of Amazonas, Department of Chemistry, Manaus, AM (Brazil)
- 2. Federal University of Amazonas, Department of Materials Engineering, Manaus, AM (Brazil)
- 3. Federal University of Amazonas, Department of Physic, Manaus, AM (Brazil)
- 4. Federal University of Mato Grosso, Department of Chemistry, LCM - Computational Materials Laboratory, Cuiaba, MT (Brazil)
Description
Highlights: • For the first time low temperatures influence on the electrochemical properties is studied. • DFT method was used to calculate the crystalline structures and lattice strain. • Films obtained at lower temperature show a high capacitance value. -- Abstract: In the present work, electrodeposition different temperatures are employed to obtain nickel hydroxide films on titanium substrate. The influence of this parameter on the electrochemical properties of the material is studied. The films are morphologically and structurally characterized using techniques of X-Ray Diffraction and Scanning Electronic Microscopy. The density functional theory (DFT) calculations are performed to study the effect of strain applied along the Ni(OH)2 unit cell and electron density maps are performed to relate with electrochemical properties. For the electrochemical characterization are used cyclic voltammetry, galvanostatic charge- discharge and electrochemical impedance spectroscopy techniques. The films deposited at 10 °C, development a structure which favors the charge storage, both in those more accessible surfaces, and in those of more difficult access, by electrolyte ions. This fact is in correspondence with the DFT results for this temperature that suggests an improvement in the material electrochemical properties, showing a high capacitance value (2549 F g1).
Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2018.12.007;
- PII
- S0040609018308071;
Publishing Information
- Journal Title
- Thin Solid Films (Print)
- Journal Volume
- 670
- Journal Page Range
- p. 24-33
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Switzerland
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 55041255
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CAPACITANCE; DENSITY FUNCTIONAL METHOD; ELECTROCHEMISTRY; ELECTRODEPOSITION; ELECTROLYTES; ELECTRON DENSITY; IMPEDANCE; MATERIALS; NICKEL HYDROXIDES; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; SURFACES; THIN FILMS; TITANIUM; VOLTAMETRY; X-RAY DIFFRACTION
- Descriptors DEC
- CALCULATION METHODS; CHEMISTRY; COHERENT SCATTERING; DEPOSITION; DIFFRACTION; ELECTRICAL PROPERTIES; ELECTROLYSIS; ELECTRON MICROSCOPY; ELEMENTS; FILMS; HYDROGEN COMPOUNDS; HYDROXIDES; LYSIS; METALS; MICROSCOPY; NICKEL COMPOUNDS; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SCATTERING; SURFACE COATING; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS; VARIATIONAL METHODS
Optional Information
- Copyright
- Copyright (c) 2018 Elsevier B.V. All rights reserved.