Fast edge extraction algorithm based on H-LBP and its application in nuclear imaging
Creators
- 1. School of Physics, Northeast Normal University, Changchun of Jilin (China)
- 2. Mathematics and Statistics School, Northeast Normal University, Changchun of Jilin (China)
Description
Nuclear imaging technology is one of the most widely used methods in nondestructive testing and extracting useful information from the images is one of the important tasks in nuclear imaging processing. H-LBP is an effective algorithm for edge extraction, however, the computational complexity and slowly computation speed restricts its feasibility in real applications. To cope with the above problems, a fast edge extraction algorithm based on H-LBP, namely FH-LBP, is proposed by optimizing the computing framework of H-LBP and adopting 1-normed sparse evaluation strategy to realize the global parameters adaptive selection. Experimental results show the new method possesses excellent performance and high robustness, which make it feasible and practical in real applications. (authors)
Additional details
Publishing Information
- Publisher
- China Atomic Energy Press
- Imprint Place
- Beijing (China)
- ISBN
- 978-7-5022-8776-4
- Imprint Title
- Progress report on nuclear science and technology in China (Vol.5). Proceedings of academic annual meeting of China Nuclear Society in 2017, No.9--Nuclear Electronics and Detection Technology sub-volume
- Imprint Pagination
- 138 p.
- Journal Page Range
- p. 96-100
Conference
- Title
- 2017 academic annual meeting of China Nuclear Society
- Dates
- 16-18 Oct 2017
- Place
- Weihai (China)
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 53102510
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALGORITHMS; CALCULATION METHODS; COMPUTERIZED TOMOGRAPHY; EVALUATION; EXTRACTION; IMAGE PROCESSING; IMAGES; NONDESTRUCTIVE TESTING; OPTIMIZATION; PERFORMANCE
- Descriptors DEC
- DIAGNOSTIC TECHNIQUES; MATERIALS TESTING; MATHEMATICAL LOGIC; PROCESSING; SEPARATION PROCESSES; TESTING; TOMOGRAPHY
Optional Information
- Notes
- 2 figs., 2 tabs., 7 refs.