Atomic simulation of ion-solid interaction in ceramics
Creators
Description
Understanding dynamic processes during ion irradiation, as well as irradiation-induced microstructural changes, requires fundamental knowledge on defect properties, defect generation in atomic collision processes, multiple ion-solid interactions and defect migration. The multiple scale simulation methods are presented in this paper, and in particular, an application on SiC is discussed in detail. Density functional theory (DFT) has been employed to determine defect energetics and the most favorable interstitial configurations in SiC. Based on DFT calculations, a new empirical potential has been developed in order to carry out large-scale simulations of microstructural evolution. Multimillion atom systems (up to 6 million) have been used to study defect production, defect clustering, multiple ion-solid interactions and structural evolution in SiC. The defect-stimulated growth and coalescence of clusters represents an important mechanism for irradiation-induced crystalline-to-amorphous transformation. The relative disordering and swelling behavior, as well as high-resolution transmission electron microscopy image simulations, based on molecular dynamics results, provide atomic-level interpretations of experimentally observed features in SiC
Additional details
Identifiers
- PII
- S0168583X03005159;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 207
- Journal Issue
- 1
- Journal Page Range
- p. 10-20
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- Symposium on ion beam processing and modification of glasses and ceramics
- Dates
- 28 Apr - 1 May 2002
- Place
- St Louis, MO (United States)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Mexico
- INIS RN
- 35042746
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ATOM COLLISIONS; COALESCENCE; CRYSTAL DEFECTS; DIAGRAMS; IMAGES; MICROSTRUCTURE; MOLECULAR DYNAMICS METHOD; SILICON CARBIDES; SOLID CLUSTERS; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- CALCULATION METHODS; CARBIDES; CARBON COMPOUNDS; COLLISIONS; CRYSTAL STRUCTURE; ELECTRON MICROSCOPY; INFORMATION; MICROSCOPY; SILICON COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.