Published May 2003 | Version v1
Journal article

Atomic simulation of ion-solid interaction in ceramics

Description

Understanding dynamic processes during ion irradiation, as well as irradiation-induced microstructural changes, requires fundamental knowledge on defect properties, defect generation in atomic collision processes, multiple ion-solid interactions and defect migration. The multiple scale simulation methods are presented in this paper, and in particular, an application on SiC is discussed in detail. Density functional theory (DFT) has been employed to determine defect energetics and the most favorable interstitial configurations in SiC. Based on DFT calculations, a new empirical potential has been developed in order to carry out large-scale simulations of microstructural evolution. Multimillion atom systems (up to 6 million) have been used to study defect production, defect clustering, multiple ion-solid interactions and structural evolution in SiC. The defect-stimulated growth and coalescence of clusters represents an important mechanism for irradiation-induced crystalline-to-amorphous transformation. The relative disordering and swelling behavior, as well as high-resolution transmission electron microscopy image simulations, based on molecular dynamics results, provide atomic-level interpretations of experimentally observed features in SiC

Additional details

Identifiers

PII
S0168583X03005159;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
207
Journal Issue
1
Journal Page Range
p. 10-20
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
Symposium on ion beam processing and modification of glasses and ceramics
Dates
28 Apr - 1 May 2002
Place
St Louis, MO (United States)

INIS

Country of Publication
Netherlands
Country of Input or Organization
Mexico
INIS RN
35042746
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ATOM COLLISIONS; COALESCENCE; CRYSTAL DEFECTS; DIAGRAMS; IMAGES; MICROSTRUCTURE; MOLECULAR DYNAMICS METHOD; SILICON CARBIDES; SOLID CLUSTERS; TRANSMISSION ELECTRON MICROSCOPY
Descriptors DEC
CALCULATION METHODS; CARBIDES; CARBON COMPOUNDS; COLLISIONS; CRYSTAL STRUCTURE; ELECTRON MICROSCOPY; INFORMATION; MICROSCOPY; SILICON COMPOUNDS

Optional Information

Copyright
Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.