Published January 28, 2009
| Version v1
Journal article
Structural and magnetic properties of an InGaAs/Fe3Si superlattice in cylindrical geometry
Creators
- 1. Institute for Integrative Nanosciences, IFW Dresden, Helmholtzstrasse 20, D-01069 Dresden (Germany)
- 2. Institute for Complex Materials, IFW Dresden, Helmholtzstrasse 20, D-01069 Dresden (Germany)
- 3. Institute for Metallic Materials, IFW Dresden, Helmholtzstrasse 20, D-01069 Dresden (Germany)
- 4. European Synchrotron Radiation Facility, BoIte Postale 220, F-38043 Grenoble Cedex (France)
- 5. Chair for Crystallography and Structural Physics, University of Erlangen-Nuernberg, Staudtstrasse 3, D-91058 Erlangen (Germany)
Description
The structure and magnetic properties of an InGaAs/Fe3Si superlattice in a cylindrical geometry are investigated by electron microscopy techniques, x-ray diffraction and magnetometry. To form a radial superlattice, a pseudomorphic InGaAs/Fe3Si bilayer has been released from its substrate self-forming into rolled-up microtubes. Oxide-free interfaces as well as areas of crystalline bonding are observed and an overall lattice mismatch between succeeding layers is determined. The cylindrical symmetry of the final radial superlattice shows a significant effect on the magnetization behavior of the rolled-up layers.
Availability note (English)
Available from http://dx.doi.org/10.1088/0957-4484/20/4/045703Additional details
Identifiers
- DOI
- 10.1088/0957-4484/20/4/045703;
- PII
- S0957-4484(09)91995-X;
Publishing Information
- Journal Title
- Nanotechnology (Print)
- Journal Volume
- 20
- Journal Issue
- 4
- Journal Page Range
- [5 p.]
- ISSN
- 0957-4484
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41020084
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- CRYSTAL DEFECTS; ELECTRON MICROSCOPY; GALLIUM ARSENIDES; INDIUM ARSENIDES; INTERFACES; IRON SILICIDES; LAYERS; MAGNETIC PROPERTIES; MAGNETIZATION; SUPERLATTICES; X-RAY DIFFRACTION
- Descriptors DEC
- ARSENIC COMPOUNDS; ARSENIDES; COHERENT SCATTERING; CRYSTAL STRUCTURE; DIFFRACTION; GALLIUM COMPOUNDS; INDIUM COMPOUNDS; IRON COMPOUNDS; MICROSCOPY; PHYSICAL PROPERTIES; PNICTIDES; SCATTERING; SILICIDES; SILICON COMPOUNDS; TRANSITION ELEMENT COMPOUNDS