PVT growth of Cd1-xZnxTe (x-0.04) films sensitive to radial rays
- 1. Ishinomaki Senshu Univ., Faculty of Science and Engineering, Ishinomaki, Miyagi (Japan)
- 2. Tohoku Inst. of Technology, Dept. of Electronics, Sendai, Miyagi (Japan)
Description
A computed digital radiography in medical field needs flat panel X-ray sensor, consisting of TFT substrate and X-ray converter film. One of the key technologies is how to make the films sensitive to radial rays. High-resistive and good quality Cd1-xZnxTe (x-0.04) poly-crystalline films are grown on ITO/glass substrate by the PVT method using a reservoir chamber which contains CdCl2 powders. Flat-like surfaces without having clear grain boundaries are observed in the films grown in the CdCl2 atmosphere and this is quite different from the one of the film grown without a reservoir. The device composed of grown film/ITO/glass is sensitive to γ-ray and this suggests the possibility of the films to be used as the detector for radial rays in computed digital radiography. (T. Tanaka)
Additional details
Publishing Information
- Imprint Title
- Radiation detectors and their uses. Proceedings of the 18th workshop on radiation detectors and their uses
- Imprint Pagination
- 234 p.
- Journal Page Range
- p. 67-73
- Report number
- KEK-PROC--2004-14
Conference
- Title
- 18. workshop on radiation detectors and their uses
- Dates
- 2-4 Feb 2004
- Place
- Tsukuba, Ibaraki (Japan)
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 36074026
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference, Non-conventional Literature
- Descriptors DEI
- CADMIUM TELLURIDES; COMPUTERIZED TOMOGRAPHY; LEAKAGE CURRENT; PHOTOLUMINESCENCE; PHYSICAL VAPOR DEPOSITION; POLYCRYSTALS; SOLID SOLUTIONS; STOPPING POWER; SUBSTRATES; X-RAY DETECTION; X-RAY RADIOGRAPHY; ZINC TELLURIDES
- Descriptors DEC
- CADMIUM COMPOUNDS; CHALCOGENIDES; CRYSTALS; CURRENTS; DEPOSITION; DETECTION; DIAGNOSTIC TECHNIQUES; DISPERSIONS; ELECTRIC CURRENTS; EMISSION; HOMOGENEOUS MIXTURES; INDUSTRIAL RADIOGRAPHY; LUMINESCENCE; MATERIALS TESTING; MIXTURES; NONDESTRUCTIVE TESTING; PHOTON EMISSION; RADIATION DETECTION; SOLUTIONS; SURFACE COATING; TELLURIDES; TELLURIUM COMPOUNDS; TESTING; TOMOGRAPHY; ZINC COMPOUNDS
Optional Information
- Notes
- 13 refs., 9 figs.