Published January 15, 2007 | Version v1
Journal article

Synthesis and characteristics of nature-superlattice-structured Bi3TiNbO9-Bi4Ti3O12 ferroelectric thin films by MOD

  • 1. Department of Information Material Science and Engineering, Guilin University of Electronic Technology, Guilin 541004 (China)
  • 2. Area of Materials and Device Physics, Department of Physical Science, Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyama-Cho, Toyonaka, Osaka 560-8531 (Japan)

Description

Natural-superlattice-structured ferroelectric thin films, Bi3TiNbO9-Bi4Ti3O12 (BTN-BIT), have been synthesized on Pt/Ti/SiO2/Si by metal organic decomposition (MOD) using BTN-BIT (1 mol:1 mol) solution. BTN-BIT films show natural-superlattice peaks below 2θ = 20o in X-ray diffraction patterns, which indicate that the BTN-BIT films annealed at 700-800 deg. C in O2 ambient are consisted of iteration of two unit cells of Bi3TiNbO9 and one unit cell of Bi4Ti3O12. As the annealing temperature increases from 600 to 750 deg. C, uniform and crack-free films, better crystallinity and ferroelectric properties can be obtained, but the pyrochlore phase in BTN-BIT films annealed over 800 deg. C would impair the ferroelectric properties. With the increase of O2 flow rate from 0.5 to 1.5 L/min, both remanent polarization P r and coercive electric field E C increase, which are mainly attributed to reduction of the vacanvies of Bi and oxide ions in the films. Natural-superlattice-structured BTN-BIT thin films having 2-1 superlattice annealed at 750 deg. C in O2 ambient with a flow rate of 1.5 L/min exhibit superior ferroelectric properties of P r = 23.5 μC/cm2 and E C = 135 kV/cm

Additional details

Identifiers

DOI
10.1016/j.mseb.2006.04.047;
PII
S0921-5107(06)00262-5;

Publishing Information

Journal Title
Materials Science and Engineering. B, Solid-State Materials for Advanced Technology
Journal Volume
136
Journal Issue
1
Journal Page Range
p. 1-4
ISSN
0921-5107
CODEN
MSBTEK

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.