Published 1996 | Version v1
Book

Performance of CdZnTe strip detectors as sub-millimeter resolution imaging gamma radiation spectrometers

  • 1. Univ. of New Hampshire, Durham, NH (United States)

Description

We report γ-ray detection performance measurements and computer simulations of a sub-millimeter pitch CdZnTe strip detector. The detector is a prototype for γ-ray astronomy measurements in the range of 20-200 keV. The prototype is a 1.5 mm thick, 64 x 64 orthogonal stripe CdZnTe detector of 0.375 mm pitch in both dimensions, with approximately one square inch of sensitive area. Using discrete laboratory electronics to process signals from 8 x 8 stripe region of the prototype we measured good spectroscopic uniformity and sub-pitch (∼ 0.2 mm) spatial resolution in both x and y dimensions. We present below measurements of the spatial uniformity, relative timing and pulse height of the anode and cathode signals, and the photon detection efficiency. We also present a technique for determining the location of the event in the third dimension (depth). We simulated the photon interactions and signal generation in the strip detector and the test electronics and we compare these results with the data. The data indicate that cathode signal - as well as the anode signal - arises more strongly from the conduction electrons rather than the holes

Additional details

Publishing Information

Publisher
IEEE Service Center.
Imprint Place
Piscataway, NJ (United States)
Imprint Title
1996 IEEE nuclear science symposium - conference record. Volumes 1, 2 and 3
Imprint Pagination
2138 p.
Journal Page Range
p. 830-834.

Conference

Title
Institute of Electrical and Electronic Engineers (IEEE) nuclear science symposium and medical imaging conference.
Dates
2-9 Nov 1996.
Place
Anaheim, CA (United States).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
28068720
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CDTE SEMICONDUCTOR DETECTORS; GAMMA DETECTION; GAMMA SPECTROMETERS; IMAGE PROCESSING; PERFORMANCE; ZINC COMPOUNDS
Descriptors DEC
DETECTION; MEASURING INSTRUMENTS; RADIATION DETECTION; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SPECTROMETERS

Optional Information

Secondary number(s)
CONF-961123--.