Technological aspects of development of pixel and strip detectors based on CdTe and CdZnTe
Description
Current and spectrometrical characteristics, stability in time and reliability of pixel and strip detectors depend on initial material properties, crystal processing quality and contacts manufacture technology. The work presents analysis of current-voltage and spectrometrical characteristics for initial CdTe and CdZnTe crystals applied for pixel and strip detectors manufacture. The crystal surface preparation before contacts manufacture comprises a modified technology. The contacts were made by photolithography with the surface protected by photoresist with further windows lift-off and crystal surface metallization in lifted-off windows. Metal pads were made by gold deposition from chloroauric acid. Thermocompression, ultrasonic and pulse wirebonding, as well as traditional contacts glueing method for CdTe and CdZnTe detectors have been tested for contacts wiring. The pulse wirebonding has revealed the best results. Wiring is made of gold wire with a diameter of 30 μm and is good enough for pixel and strip wirebonding, providing rather low labour-intensiveness for their assembly by standard equipment. The possibility of fabrication of pressing contacts to strip and pixel detectors by Zebra elastomeric connectors has been investigated. The pressing contacts have provided qualitative and reliable electrical contact and signal layout from pixels and strips to readout electronics. Developed technologies were applied in the manufacture of the following CdTe and CdZnTe detectors: 4x4 pixels detector with rectangular pixels 0.65x0.65 mm and pitch 0.75 mm; 4x4 pixels ring miltiple-electrode detector with anode diameter 0.32 mm and pitch 0.75 mm; strip detector with 100 μm width strip and 125 μm pitch. The 4x4 pixels CdZnTe detector has provided at optimal temperature energy resolutions of 808 eV and 1.19 keV at energies of 5.9 and 59.6 keV, respectively. Interstrip resistance between two strips with a distance of 25 μm on detector was 2-8 GΩ
Additional details
Identifiers
- PII
- S0168900200010913;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 460
- Journal Issue
- 1
- Journal Page Range
- p. 27-34
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Germany
- INIS RN
- 33047566
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- CDTE SEMICONDUCTOR DETECTORS; ELECTRIC CONDUCTIVITY; ELECTRIC CONTACTS; ENERGY RESOLUTION; FABRICATION; KEV RANGE 01-10; KEV RANGE 10-100; MANUFACTURING; POSITION SENSITIVE DETECTORS; X-RAY DETECTION; X-RAY SPECTROSCOPY
- Descriptors DEC
- DETECTION; ELECTRICAL EQUIPMENT; ELECTRICAL PROPERTIES; ENERGY RANGE; EQUIPMENT; KEV RANGE; MEASURING INSTRUMENTS; PHYSICAL PROPERTIES; RADIATION DETECTION; RADIATION DETECTORS; RESOLUTION; SEMICONDUCTOR DETECTORS; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2001 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.