Published July 2007 | Version v1
Journal article

Electromagnetically induced transparency line shapes for large probe fields and optically thick media

  • 1. Department of Physics, University of Rochester, Rochester, New York 14627 (United States)

Description

We calculate the line shape and linewidths for electromagnetically induced transparency (EIT) in optically thick, Doppler broadened media (buffer gasses are also considered). In generalizing the definition of the EIT linewidth to optically thick media, we find two different linewidth definitions apply depending on whether the experiment is pulsed or continuous wave (cw). Using the cw definition for the EIT line shape we derive analytic expressions describing the linewidth as a function of optical depth. We also review the EIT line shapes in optically thin media and provide physical arguments for how the line shapes change as a function of various parameters

Additional details

Identifiers

Publishing Information

Journal Title
Physical Review. A
Journal Volume
76
Journal Issue
1
Journal Page Range
p. 013801-013801.13
ISSN
1050-2947
CODEN
PLRAAN

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39033586
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS;
Descriptors DEI
BUFFERS; DOPPLER BROADENING; ELECTROMAGNETIC FIELDS; FUNCTIONS; LINE WIDTHS; OPACITY; PROBES; REVIEWS
Descriptors DEC
DOCUMENT TYPES; LINE BROADENING; OPTICAL PROPERTIES; PHYSICAL PROPERTIES

Optional Information

Notes
(c) 2007 The American Physical Society