Published July 2007
| Version v1
Journal article
Electromagnetically induced transparency line shapes for large probe fields and optically thick media
Creators
- 1. Department of Physics, University of Rochester, Rochester, New York 14627 (United States)
Description
We calculate the line shape and linewidths for electromagnetically induced transparency (EIT) in optically thick, Doppler broadened media (buffer gasses are also considered). In generalizing the definition of the EIT linewidth to optically thick media, we find two different linewidth definitions apply depending on whether the experiment is pulsed or continuous wave (cw). Using the cw definition for the EIT line shape we derive analytic expressions describing the linewidth as a function of optical depth. We also review the EIT line shapes in optically thin media and provide physical arguments for how the line shapes change as a function of various parameters
Additional details
Identifiers
Publishing Information
- Journal Title
- Physical Review. A
- Journal Volume
- 76
- Journal Issue
- 1
- Journal Page Range
- p. 013801-013801.13
- ISSN
- 1050-2947
- CODEN
- PLRAAN
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39033586
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- BUFFERS; DOPPLER BROADENING; ELECTROMAGNETIC FIELDS; FUNCTIONS; LINE WIDTHS; OPACITY; PROBES; REVIEWS
- Descriptors DEC
- DOCUMENT TYPES; LINE BROADENING; OPTICAL PROPERTIES; PHYSICAL PROPERTIES
Optional Information
- Notes
- (c) 2007 The American Physical Society