Effect of Sonication Time on the Production of Graphene by Electrochemical Exfoliation Method
- 1. School of Materials and Mineral Resources Engineering, Engineering Campus, Universiti Sains Malaysia, 14300 Nibong Tebal, Pulau Pinang (Malaysia)
- 2. Department of Electrical and Electronic Engineering, Toyohashi University of Technology, Aichi Toyohashi 441-8580 (Japan)
- 3. Department of Physics, University of Yangon, 11041 Kamayut, Yangon (Myanmar)
Description
In this study, Graphene has been synthesized by using electrochemical exfoliation method. Effect of sonication times (15, 30 and 45 min) at room temperature on the production of graphene was investigated. The synthesized graphene were characterized by X-ray diffraction (XRD), Fourier transform infrared spectroscopy (FTIR) and Atomic Force Microscopy (AFM). The crystal structure of the exfoliated graphene were analyzed using XRD. The graphene flakes exhibit a sharp peak centered at 26.5°corresponding to the (002) plane of graphene crystal. It is found that, the crystallite sizes is gradually decreased with increased in sonication time. The FTIR spectrum reveals the prominent appearance of C-O-H group which indicate that OH− radicals exist in conjunction with exfoliated graphene sheets. Graphene flakes with average thickness of 0.2 nm to 0.8 nm were observed using AFM. The electrical conductivity results showed that 45 min sonication time produced the highest electrical conductivity (1.38×102sm−1). (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/1082/1/012031Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 1082
- Journal Issue
- 1
- Journal Page Range
- [5 p.]
- ISSN
- 1742-6596
Conference
- Title
- Regional Conference on Materials; AMC 2017: ASEAN Microscopy Conference 2017
- Acronym
- RCM 2017
- Dates
- 12-13 Dec 2017
- Place
- Penang (Malaysia)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 53023142
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; CRYSTALS; ELECTRIC CONDUCTIVITY; ELECTROCHEMISTRY; FOURIER TRANSFORM SPECTROMETERS; GRAPHENE; HYDROXYL RADICALS; INFRARED SPECTRA; THICKNESS; X-RAY DIFFRACTION
- Descriptors DEC
- CARBON; CHEMISTRY; COHERENT SCATTERING; DIFFRACTION; DIMENSIONS; ELECTRICAL PROPERTIES; ELEMENTS; MEASURING INSTRUMENTS; MICROSCOPY; NONMETALS; PHYSICAL PROPERTIES; RADICALS; SCATTERING; SPECTRA; SPECTROMETERS