Published 2012
| Version v1
Journal article
First comparison of spectral responsivity in the soft X-ray region
Creators
- 1. National Institute of Advanced Industrial Science and Technology - AIST, NMIJ, Tsukuba 305-8568, (Japan)
- 2. Physikalisch-Technische Bundesanstalt - PTB, Abbestrasse 2-12, 10587 Berlin, (Germany)
Description
The first comparison of spectral responsivity scales in the soft x-ray region from 360 eV to 5000 eV has been carried out between the Physikalisch-Technische Bundesanstalt (PTB) and the National Institute of Advanced Industrial Science and Technology (AIST). Two semiconductor photodiodes used as transfer detectors were calibrated using monochromatized synchrotron radiation and cryogenic electrical substitution radiometers as the primary detector standards at these institutes. The primary detector standard at AIST was confirmed to be in agreement with that at PTB at the level of the relative expanded uncertainty. (authors)
Availability note (English)
Available from doi: http://dx.doi.org/doi:10.1088/0026-1394/49/4/501Additional details
Identifiers
Publishing Information
- Journal Title
- Metrologia
- Journal Volume
- 49
- Journal Issue
- no.4
- Journal Page Range
- p. 501-506
- ISSN
- 0026-1394
- CODEN
- MTRGAU
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 44000825
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S43: PARTICLE ACCELERATORS;
- Descriptors DEI
- CALIBRATION; DATA COVARIANCES; INTERLABORATORY COMPARISONS; MONOCHROMATIC RADIATION; PHOTODIODES; RADIOMETERS; SOFT X RADIATION; SYNCHROTRON RADIATION
- Descriptors DEC
- BREMSSTRAHLUNG; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; MEASURING INSTRUMENTS; RADIATION DETECTORS; RADIATIONS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; X RADIATION
Optional Information
- Notes
- 27 refs.