Efficiency studies on semipolar GaInN-GaN quantum well structures
- 1. Institute of Optoelectronics, Ulm University (Germany)
Description
In order to clarify the reasons for the fairly poor electroluminescence (EL) performance of semipolar LED structures grown on patterned sapphire wafers, we have analyzed both, pure photoluminescence (PL) test structures without doping only containing 5 GaInN quantum wells and full EL test structures, all emitting at a wavelength of about 510 nm. Evaluating the PL intensity over a wide range of temperatures and excitation powers, we conclude that such quantum wells possess a fairly large internal quantum efficiency of about 20%. However, on EL test structures containing nominally the same quantum wells, we obtained an optical output power of only about 150μW at an applied current of 20 mA. This may be due partly to some thermal destruction of the quantum wells by the overgrowth with p-GaN. Even more important seems to be the not yet finally optimized p-doping of these structures. (copyright 2016 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim)
Availability note (English)
Available from: http://dx.doi.org/10.1002/pssa.201600340Additional details
Identifiers
Publishing Information
- Journal Title
- Physica Status Solidi. A, Applications and Materials Science
- Journal Volume
- 213
- Journal Issue
- 12
- Journal Page Range
- p. 3117-3121
- ISSN
- 1862-6300
- CODEN
- PSSABA
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 48029818
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CARRIER DENSITY; DOPED MATERIALS; ELECTROLUMINESCENCE; GALLIUM NITRIDES; HALL EFFECT; INDIUM NITRIDES; ION MICROPROBE ANALYSIS; LIGHT EMITTING DIODES; MAGNESIUM ADDITIONS; MASS SPECTROSCOPY; PHOTOLUMINESCENCE; P-TYPE CONDUCTORS; QUANTUM EFFICIENCY; QUANTUM WELLS; SAPPHIRE; SUBSTRATES; TEMPERATURE DEPENDENCE
- Descriptors DEC
- ALLOYS; CHEMICAL ANALYSIS; CORUNDUM; EFFICIENCY; EMISSION; GALLIUM COMPOUNDS; INDIUM COMPOUNDS; LUMINESCENCE; MAGNESIUM ALLOYS; MATERIALS; MICROANALYSIS; MINERALS; NANOSTRUCTURES; NITRIDES; NITROGEN COMPOUNDS; NONDESTRUCTIVE ANALYSIS; OXIDE MINERALS; PHOTON EMISSION; PNICTIDES; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SEMICONDUCTOR MATERIALS; SPECTROSCOPY
Optional Information
- Notes
- With 8 figs.