Published March 2016 | Version v1
Journal article

Enhanced carrier injection in InGaN/GaN multiple quantum wells LED with polarization-induced electron blocking barrier

  • 1. Department of Electrical and Computer Engineering, National University of Singapore, 4 Engineering Drive 3, Singapore 117576 (Singapore)
  • 2. Institute of Materials Research and Engineering (IMRE), A*STAR (Agency for Science, Technology and Research), 2 Fusionopolis Way, Innovis 08-03, Singapore 138634 (Singapore)
  • 3. Singapore-MIT Alliance for Research and Technology, 1 CREATE Way, Singapore 138602 (Singapore)

Description

Highlights: • A novel LED structure with polarization-induced barrier (PIB) was designed. • Numerical study shows enhanced carrier injections in the PIB LED. • Significant improvement in quantum efficiency of the PIB LED compared with the conventional LED with an AlGaN electron blocking layer. In this report, we designed a light emitting diode (LED) structure in which an N-polar p-GaN layer is grown on top of Ga-polar In0.1Ga0.9N/GaN quantum wells (QWs) on an n-GaN layer. Numerical simulation reveals that the large polarization field at the polarity inversion interface induces a potential barrier in the conduction band, which can block electron overflow out of the QWs. Compared with a conventional LED structure with an Al0.2Ga0.8N electron blocking layer (EBL), the proposed LED structure shows much lower electron current leakage, higher hole injection, and a significant improvement in the internal quantum efficiency (IQE). These results suggest that the polarization induced barrier (PIB) is more effective than the AlGaN EBL in suppressing electron overflow and improving hole transport in GaN-based LEDs.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.physe.2015.10.036

Additional details

Identifiers

DOI
10.1016/j.physe.2015.10.036;
PII
S1386947715302654;

Publishing Information

Journal Title
Physica E. Low-Dimensional Systems and Nanostructures (Print)
Journal Volume
77
Journal Page Range
p. 127-130
ISSN
1386-9477

Optional Information

Copyright
Copyright (c) 2015 Elsevier B.V. All rights reserved.