Shallow impurities in semiconductors

This volume contains the Proceedings of the 5th International Conference on Shallow Impurities in Semiconductors (ICSIS-V). The ICSIS conference, which was linked to the 21st International Conference on Physics of Semiconductors (Beijing), was held at the International Conference Center Kobe (ICCK), Kobe, in Hyogo prefecture during the week of 5-8 August 1992 and was attended by 145 people. The conference is devoted to the basic science aspects of shallow impurities in the well-known semiconductors and to closely related subjects. In addition to the 75 contributed papers, there were two plenary, eight invited and five late news papers representing a cross section of the most active areas of research in the PHYSICS, CONTROL and CHARACTERISATION of shallow impurities in semiconductors and superlattices. Most of these 83 papers and 5 short communications are included in these proceedings on the basis of their coverage of recent topics and their importance. (orig.)