Published August 1993 | Version v1
Journal article Metadata-only

Properties of CdTe(Cl) crystal used for radiation detector

Creators

  • 1. Tohoku Inst. of Tech., Taihakuku (Japan)
  • 2. RAYTECH Co., Hiraidecho, Utsunomiya (Japan)

Description

The authors have developed a new method of growing CdTe crystals doped with chlorine by using a radio frequency (RF)-travelling heater method (THM) which can provide excellent uniformity of Cl atoms in crystal. They discuss the relationship between response characteristics of γ-ray detector and crystal properties studied by Photoluminescence (PL) measurements. In the RF-THM crystal sample, the emission intensity ratios between the line of 1.5932 eV and 1.5905 eV due to bound exciton relating to chlorine are nearly constant for all parts of the one ingot. From this result, it is suggested that the Cl atoms are uniformly distributed through the whole of the crystal. Using crystals grown by this method, a large number of high quality radiation detectors which exhibit the same characteristics can be produced from one CdTe ingot

Additional details

Publishing Information

Journal Title
IEEE Transactions on Nuclear Science
Journal Volume
40
Journal Issue
4 part 1
Journal Page Range
p. 405-408.
ISSN
0018-9499
CODEN
IETNAE

Conference

Title
Institute of Electrical and Electronic Engineers (IEEE) nuclear science symposium and medical imaging conference.
Dates
25-31 Oct 1992.
Place
Orlando, FL (United States).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
25019130
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference, Numerical Data
Descriptors DEI
CADMIUM TELLURIDES; CDTE SEMICONDUCTOR DETECTORS; CHLORINE; CRYSTAL GROWTH; DOPED MATERIALS; EXPERIMENTAL DATA; FABRICATION; GAMMA DETECTION; PHOTOLUMINESCENCE; RESPONSE FUNCTIONS
Descriptors DEC
CADMIUM COMPOUNDS; CHALCOGENIDES; DATA; DETECTION; ELEMENTS; EMISSION; FUNCTIONS; HALOGENS; INFORMATION; LUMINESCENCE; MATERIALS; MEASURING INSTRUMENTS; NONMETALS; NUMERICAL DATA; PHOTON EMISSION; RADIATION DETECTION; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; TELLURIDES; TELLURIUM COMPOUNDS

Optional Information

Secondary number(s)
CONF-921005--.